2024年3月28日发(作者：户迎天)
Designation:F68–05
StandardSpecificationfor
Oxygen-FreeCopperinWroughtFormsforElectron
Devices
1
ThisstandardisissuedunderthefixeddesignationF68;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginal
adoptionor,inthecaseofrevision,script
epsilon(e)indicatesaneditorialchangesincethelastrevisionorreapproval.
*
1.1Thisspecificationestablishestherequirementsfor
wroughtandfabricatedshapesmadefromCopperUNS
2
No.
C10100,conformingtothechemicalrequirementsofSpecifi-
cationB170,Grade1,andsuitableforuseinelectrondevices.
1.2Therequirementsofthisspecificationareinadditionto
thoseprescribedinthefollowingproductspecificationsappro-
priatetothematerialbeingordered:B1,B2,B75,B75M,
B152/B152M,B170,B187/B187M,B272,
caseofconflict,however,thisspecificationshalltakeprece-
dence.
1.3Theinch-poundunitsarethestandardforthisspecifi-
valuesgiveninparenthesesareforinformationonly.
1.4Thefollowingsafetyhazardcaveatappliestosections
17.4,17.5and18.7ofthisspecification:Thisstandarddoesnot
purporttoaddressallofthesafetyconcerns,ifany,associated
eresponsibilityoftheuserofthisstandard
toestablishappropriatesafetyandhealthpracticesand
determinetheapplicabilityofregulatorylimitationspriorto
use.
ncedDocuments
2.1ASTMStandards:
3
B1SpecificationforHard-DrawnCopperWire
B2SpecificationforMedium-Hard-DrawnCopperWire
B3SpecificationforSoftorAnnealedCopperWire
B75SpecificationforSeamlessCopperTube
B75MSpecificationforSeamlessCopperTube(Metric)
ThisspecificationisunderthejurisdictionofASTMCommitteeB05onCopper
andCopperAlloysandisthedirectresponsibilityofSubcommitteeB05.02onRod,
Bar,Wire,Shapes,andForgings.
CurrenteditionapprovedOct.1,ally
eviouseditionapprovedin2004asF68–99(2004).
2
TheUNSSystemforcopperandcopperalloys(seePracticeE527)isasimple
expansionoftheformerstandarddesignationsystemaccomplishedbytheaddition
ofaprefix“C”andasuffix“00”.Thesuffixcanbeusedtoaccommodate
compositionvariationsofthebasealloy.
3
ForreferencedASTMstandards,visittheASTMwebsite,,or
contactASTMCustomerServiceatservice@ualBookofASTM
Standardsvolumeinformation,refertothestandard’sDocumentSummarypageon
theASTMwebsite.
1
B152/B152MSpecificationforCopperSheet,Strip,Plate
andRolledBar
B170SpecificationforOxygen-FreeElectrolyticCopper—
RefineryShapes
B187/B187MSpecificationforCopperBar,BusBar,Rod
andShapes
B188SpecificationforSeamlessCopperBusPipeand
Tube
B193TestMethodforResistivityofElectricalConductor
Materials
B248SpecificationforGeneralRequirementsforWrought
CopperandCopper-AlloyPlate,Sheet,StripandRolled
Bar
B248MSpecificationforGeneralRequirementsfor
WroughtCopperandCopper-AlloyPlate,Sheet,Stripand
RolledBar[Metric]
B249/B249MSpecificationforGeneralRequirementsfor
WroughtCopperandCopper-AlloyRod,Bar,Shapes,and
Forgings
B250/B250MSpecificationforGeneralRequirementsfor
WroughtCopper-AlloyWire
B272SpecificationforCopperFlatProductswithFinished
(RolledorDrawn)Edges(FlatWireandStrip)
B372SpecificationforSeamlessCopperandCopper-Alloy
RectangularWaveguideTube
B577TestMethodsforDetectionofCuprousOxideHy-
drogenEmbrittlementSusceptibilityinCopper
E29PracticeforUsingSignificantDigitsinTestDatato
DetermineConformancewithSpecifications
E112TestMethodsforDeterminingAverageGrainSizes
E527PracticeforNumberingMetalsandAlloys(UNS)
2.2ASTMAdjunct:
ComparisonChart
4
ology
3.1Fordefinitionsoftermsrelatedtothisproduct,referto
theterminologysectionsofSpecifications
B3,B188,B248,
B248M,B249/B249M,B250/B250M,orB251.
djunctNo.
ADJF0068.
4
*ASummaryofChangessectionappearsattheendofthisstandard.
Copyright©ASTMInternational,100BarrHarborDrive,POBoxC700,WestConshohocken,PA19428-2959,UnitedStates.
1
F68–05
3.2DefinitionofTermsSpecifictoThisStandard:
3.2.1extrusionpipe,n—alaminationresultingfromthe
flowoftheoxidesurfaceofabilletintothearticlebeing
extrudedandusuallyconfinedtothetrailing-endportionofthe
extrudedproduct.
3.2.2oxygen-free,adj—electrolyticcopperproducedsub-
stantiallyfreeofcuprousoxideandcontainingnomorethan10
ppmoxygen,asdeterminedbymetallographicexaminationat
753underpolarizedlight,andmanufacturedwithouttheuse
ofmetallicormetalloidaldeoxidizers.
3.2.3oxygen-free,grade1,adj—asdefinedin
3.2.2except
pper
isalsocommonlytermed“oxygen-freeelectronic.”
3.2.4rms,n—root-mean-square,astatisticalmeasureof
surfaceroughnessusuallydeterminedbymeansofaprofilo-
meter.
ngInformation
4.1Ordersfortheproductshallincludethefollowing
information:
4.1.1ThedesignationandyearofissueofbothSpecifica-
tionF68andthebasicproductspecificationinvolved,
4.1.2Shapeofproduct,
4.1.3Size,
4.1.4Totalestimatedweightornumberofpieces,orboth,
foreachsizeandshape,
4.1.5TheSpecificationF68Classofmaterial,
4.1.6Intendedapplication(forexample,waveguide),
4.1.7Temper,
4.1.8Heatidentificationortraceabilitydetails,
4.1.9Certification,
4.2Thefollowingoptionsareavailable:
4.2.1Milltestreport,
4.2.2Specialpackaging,
4.2.3Specialmarking.
alsandManufacture
5.1Material—Thematerialshallbeoxygen-freeelectronic
copperwhichconformstotherequirementsofSpecification
B170,Grade1.
5.2Manufacture—Themanufacturingprocessshallcon-
formtotherequirementsofthisspecificationandtothebasic
productspecificationtowhichtheproductwasordered.
alComposition
6.1Thecastrefineryshapeshallconformtotherequire-
mentsspecifiedinSpecification
B170,Grade1,Table1.
6.1.1Coppershallbetakenasthedifferencebetweenthe
sumofresultsforGrade1specifiedelementsand100%.
6.2Thesecompositionlimitsdonotprecludethepossible
maybeestab-
lishedandanalysisrequiredforunnamedelementsbyagree-
mentbetweenthemanufacturerandthepurchaser.
7.1Thetemperofthewroughtorfabricatedproductsup-
pliedshallconformtotherequirementsofthebasicproduct
specificationtowhichitwasordered.
2
alProperties
8.1ElectricalResistivity—Themaximummassresistivity
shallbe0.15176ohmsg/m
2
(conductivity101.0%minimum,
InternationalAnnealedCopperStandard(IACS)at20°Cwhen
testedintheannealedcondition.
8.2Scaling—Whenagreeduponbetweencustomerand
supplier,thetestspecimensofoxygen-freecoppershallshow
substantialsurfaceoxideadherencewhensubjectedtotestas
describedin
18.7.
N
OTE
1—Thepurposeofthistestistodistinguishbetweenoxygenfree
izedcopperwillnotretainthesurface
oxideinthistest.
icalProperties
9.1Allproductsshallconformtothemechanicalproperty
requirementsofthebasicproductspecificationtowhichthe
itemwasordered,withthefollowingexception:
and
intendedforgasketsorfordeepdrawingshallconformtothe
requirementsprescribedinTable1.
enEmbrittlement(ReverseBendTest
Method)
10.1Specimensshallwithstandaminimumoftenreverse
ceofblisters,uponvisual
examination,shallbecauseforrejection.
N
OTE
2—Fracturedareasofthebentsamplesshouldshowsome
reductioninareaandhaveadistorted,albreak
willhavetheappearanceofacupandconetensilefailure.
lExamination
11.1Whenexaminedthesamplesshallhave:
11.1.1Arelativelyuniformsurfacefreeofirregularrough
spotssometimestermedopengrains,
11.1.2Edgesfreeofseams,lapsandcracks,
11.1.3Crosssectionsfreeofbreaks,inclusionsorextrusion
pipe.
lExaminations
12.1SpecialMacroExamination:
12.1.1Thesamplesshallshownosubsurfacedefectsin
excessofthefollowinglimits:
12.1.1.1TubularProducts:
(1)TubesforExhaust(Pinch-off)Purposes:
(a)Forwallthicknessover0.1in.(2.5mm),nodefects
ontheexternalsurfacedeeperthan0.005in.(0.13mm).
(b)Forwallthicknessesupto0.1(2.5mm)inclusive,no
defectsontheexternalsurfacedeeperthan5%ofthewall
thickness.
(c)Nosignificantdefectsontheinsidesurfacewhen
examinedwithfiberopticsoraboroscope.
TABLE1GrainSize
Thickness
Lessthan0.040in.(1.0mm)
0.040to0.125in.(1.0to3.2mm)
A
AverageGrain
Size,
max,mm
0.035
0.050
Hardness
HRF
A
max
75
75
Forinformationonly.
F68–05
(2)Waveguides—Nodefectsontheexternalsurfacedeeper
than0.005in.(0.13mm)or5%ofthewallthickness,
ificantdefectsontheinside
surfacewhenexaminedwithfiberopticsoraboroscope.
(3)TubeforOtherApplications—Nodefectsoneitherthe
internalorexternalsurfacesdeeperthan0.020in.(0.51mm)or
5%ofthewallthickness,whicheveristhesmaller.
12.1.1.2BarandPlateProducts—Nodefectsdeeperthan
0.06in.(1.6mm)or5%ofthethickness,whicheveristhe
smaller.
12.1.1.3Sheet,StripandFlatWireProducts—Nodefects
deeperthan0.005in.(0.13mm)or5%ofthethickness,
whicheverissmaller.
12.1.1.4RodandWireProducts:
(1)RodandWirelessthan0.19in.(4.8mm)in
Diameter—Nodefectsdeeperthan0.005in.(0.13mm)or5%
ofthediameter,whicheverissmaller.
(2)RodandWire0.19in.(4.8mm)andOverin
Diameter—Nodefectsdeeperthan0.06in.(1.6mm)or5%of
thediameter,whicheverissmaller.
12.2SpecialMicroscopicalExamination:
12.2.1SamplesshallbeclassifiedbycomparisontoPlate1,
whichisavailablefromASTMInternationalHeadquartersas
anadjunct(see
2.2).
12.2.1.1Productwhosesampleshaveanappearancein
conformingtoeitherClass1orClass2shallbeconsidered
acceptable.
12.2.1.2Subsurfacemicroporositysimilartothosetypical
ofClass3,4or5asillustratedinPlate1,arepermissiblein
Class1and2materialprovidedthemicroporositydoesnot
appearbelowthemetalsurfaceatdepthsexceedingthe
following:
(1)TubularProducts:
(a)TubesforExhaustPurposesandWaveguides—No
indicationsatanydepthbelowthesurface.
(b)TubesforOtherApplications—Microporositypermis-
sibletodepthsof0.020in.(0.51mm)or5%ofthetubewall,
whicheverissmaller.
(2)BarandPlate—Microporositypermissibletodepthsof
0.06in.(1.5mm)or5%ofthethickness,whicheverissmaller.
(3)Sheet,StripandFlatWire—Microporositypermissible
todepthsof0.010in.(0.25mm)or5%ofthethickness,
whicheverissmaller.
(4)RodandWireProducts:
(a)RodandWirelessthan0.19in.(4.8mm)in
Diameter—Microporositypermissibletodepthsof0.010in.
(0.25mm)or5%ofthediameterorthickness,whicheveris
smaller.
(b)RodandWire0.19in.(4.8mm)andOverin
Diameter—Microporositypermissibletodepthsof0.06in.
(1.5mm)or5%ofthediameterorthickness,whicheveristhe
smaller.
12.2.1.3Productwhosesampleshaveanappearancecorre-
spondingtoClass3,4or5andnotinconformancewith
12.2.1.2,shallbeacceptableonlybyagreementbetweenthe
manufacturerorsupplierandthepurchaser.
3
ions,MassandPermissibleVariations
13.1Thedimensionaltolerancesfortheproductdescribed
bythisspecificationshallbeasprescribedinthebasicproduct
specificationtowhichitwasordered.
nship,FinishandAppearance
14.1Theproductshallbepreparedandhandledinsucha
mannerastobesubstantiallyfreefromsurfaceoxideandthe
presenceofforeignmaterialsuchasmetalchips,dirtand
grease.
ng
15.1Thesamplingpracticeshallbeasprescribedinthe
basicproductspecificationtowhichitwasordered.
15.1.1Thenumberofsamplepiecestobeselected,how-
ever,shallbetwicethenumberprescribedinthebasicproduct
specification.
ofTestsandRetests
16.1Tests—Thenumberofsamplessubmittedtoalltests
shallbetwicethatrequiredbythebasicproductspecification
towhichtheproductwasordered.
16.2Retests:
16.2.1Retestsarepermittedasstatedinthebasicproduct
specificationtowhichtheproductwasorderedfortests
associatedwiththebasicproductspecification.
16.2.2Retestsshallbepermittedfortestsandexaminations
requiredbythisspecification.
16.2.3Productswhichfailinretestshallberejected.
enPreparation
17.1ChemicalComposition—Analyticalsampleprepara-
tionshallbeasdirectedinthebasicproductspecificationto
whichtheproductwasordered.
17.2ElectricalResistivity—Specimenpreparationshallbe
asdirectedinthebasicproductspecificationtowhichthe
productwasordered.
17.3GrainSize—Specimenpreparationshallbeasdirected
inthebasicproductspecificationtowhichtheproductwas
ordered.
17.4GeneralandSpecialMacroExamination:
17.4.1Transversesectionsofthesamplesshallbemachined
toa63rmsorsmoothersurfacefinishanddegreased.
17.4.1.1Inaproperlyventilatedfumehood,etchthe
samplesfor3to5minbyloweringthesamplesintoafreshly
preparedetchingsolutionandslowlyagitate.
17.4.1.2Preparetheetchingsolutionbymixingequalparts
ofconcentratedreagentgradenitricacid(HNO
3
)anddeionized
5gramsofcopperforeachliterofthe
50%acidsolutionandcoolthesolutiontoambienttempera-
utionshallbekeptfreeofdirtand
maintainedat7565°F(2463°C)duringuse.
(Warning—Donotpourthewaterintotheacid.)
17.4.1.3Removethesamplesperiodicallyfromtheetching
solutionandvisuallyexaminetodeterminewhethersufficiently
thesamplestendtostain,add25mLof
concentratedreagentgradehydrochloricacid(HCl)toeach
literofetchingsolution.
F68–05
17.4.1.4Afteretching,rinsethesamplesthoroughlywith
deionizedordistilledwaterandblowdrywithairforexami-
nation.
17.5SpecialMicroscopicalExamination:
17.5.1Cutanddegreaselongitudinalsamplestakenfrom
thefinishedproduct.
17.5.2Heatthesamplesto1870640°F(1020620°C)and
holdattemperaturefor30mininanatmospherecomprising
notlessthan10%ycooltoambienttempera-
turebyquenchinginwaterwithoutundueexposuretoairor
quicklycoolthespecimensinthesameatmosphere.
17.5.3Polishandetchforexaminationusingtheetching
solutiondescribedin
Table2.(Warning—Withconstantgentle
stirringorswirlingofthewater,
pourthewaterintotheacid.)
17.6HydrogenEmbrittlement(ReverseBendTest
Method)—SamplepreparationshallbeinaccordancewithTest
SpecimensSectionofTestMethodsB577.
17.6.1TubularProducts:
17.6.1.1Fortubewithanoutsidediameterof0.12in.(3
mm)orless,thesamplesshallbeflattenedbypressingor
rolling.
17.6.1.2Fortubewithanoutsidediametergreaterthan0.12
in.(3mm)butlessthan1in.(25.4mm)thesamplesshallbe
cutlongitudinallyfromthetubeandflattened,whennecessary
byeitherpressingorrolling.
17.6.1.3Fortubewithanoutsidediameterof1in.(25.4
mm)andgreater,samplesmaybecuteitherparallelor
transversetotheaxisofthetubeandthenflattened.
17.6.1.4Shouldthethicknessofanyflattenedsamplebe
greaterthan0.081in.(2.06mm),itshallbemachinedtoa
thicknessof0.08160.001in.(2.0660.025mm)andatleast
oneoftheoriginalsurfacesofthefinishedtubeshallbe
retainedononeofthesamples.
17.6.1.5Samplesshallbeheatedto1560640°F
(850620°C)andheldatthattemperatureforaperiodof30
mininanatmospherecontainingnotlessthan10%hydrogen
andthenrapidlycooledbyquenchinginambienttemperature
waterwithoutundueexposuretoairorquicklycoolthe
specimensinthesameatmosphere.
17.6.2BarandPlateProducts:
17.6.2.1Samplesshallbemachinedtoathicknessof
0.08160.001in.(2.0660.025mm)andatleastoneofthe
originalsurfacesofthefinishedproductshallberetainedon
oneofthesamples.
17.6.2.2Samplesshallbeheatedto1560640°F
(850620°C)andheldatthattemperatureforaperiodof30
mininanatmospherecontainingnotlessthan10%hydrogen
andthenrapidlycooledbyquenchinginambienttemperature
waterwithoutundueexposuretoairorquicklycoolthe
specimensinthesameatmosphere.
17.6.3Sheet,StripandFlatWireProducts:
TABLE2EtchingSolution
SodiumDichromate
SodiumChloride
SulfuricAcid(Conc.)
Water(deionizedordistilled)
16grams
12grams
64mL
100mL
17.6.3.1Forproductswithathicknessof0.081in.(2.06
mm)orless,thesamplesshallbepreparedwithoutmachining.
17.6.3.2Forproductswithathicknessgreaterthan0.081in.
(2.06mm),thesamplesshallbemachinedtoathicknessof
0.08160.001in.(2.0660.025mm)andatleastoneofthe
originalsurfacesofthefinishedproductshallberetainedon
oneofthesamples.
17.6.3.3Samplesshallbeheatedto1560640°F
(850620°C)andheldatthattemperatureforaperiodof30
mininanatmospherecontainingnotlessthan10%hydrogen
andthenrapidlycooledbyquenchinginambienttemperature
waterwithoutundueexposuretoairorquicklycoolthe
specimensinthesameatmosphere.
17.6.4RodandWireProducts:
17.6.4.1Forproductswithadiameterorthicknessof0.081
in.(2.06mm)andunderthesampleshallbepreparedwithout
machining.
17.6.4.2Forproductswithadiameterorthicknessgreater
than0.081in.(2.06mm)thesamplesshallbemachinedtoa
thicknessof0.08160.001in.(2.0660.025mm)andatleast
oneoftheoriginalsurfacesofthefinishedproductshallbe
retainedononeofthesamples.
17.6.4.3Samplesshallbeheatedto1560640°F
(850620°C)andheldatthattemperatureforaperiodof30
mininanatmospherecontainingnotlessthan10%hydrogen
andthenrapidlycooledbyquenchinginambienttemperature
waterwithoutundueexposuretoairorquicklycoolthe
specimensinthesameatmosphere.
thods
18.1ChemicalComposition:
18.1.1Thetestmethodsusedforthedeterminationof
compositionshallbeasspecifiedinthebasicproductspecifi-
cationtowhichthematerialwasordered.
18.1.2Thetestmethod(s)usedforthedeterminationof
elementsrequiredbycontractualorpurchaseorderagreement
shallbeasagreeduponbetweenthemanufacturerorsupplier
andthepurchaser.
18.2GrainSize—Grainsizeshallbedeterminedinaccor-
dancewithTestMethods
ofdispute,the
interceptmethodshallbeused.
18.3ElectricalResistivity—Electricalresistivityshallbe
determinedinaccordancewithTestMethods
e-
mentuncertaintyshallnotexceed60.15%.
18.4GeneralExaminationandSpecialMacro
Examination—Examinationshallbevisuallywiththeunaided
eyeorat103magnification.
18.5SpecialMicroscopicalExamination—Examination
shallbemadeat1003magnificationandclassifiedbycom-
parisontoPlate1.
18.6HydrogenEmbrittlementSusceptibility(ReverseBend
TestMethod)—Hydrogenembrittlementshallbedeterminedin
accordancewithTestMethodDofTestMethodsB577.
18.7ScalingTest—Thesamplesshallbeheatedinairina
cleanmufflefurnacefor30minat1560640°F(850620°C)
andimmediatelyquenchedinclean,ambienttemperature
ancecriteriatobebyagreementbetweencus-
tomerandsupplier.
4
F68–05
ficanceofNumericalLimits
19.1Forthepurposeofdeterminingcompliancewithspeci-
fiedlimitsanobservedvalueorcalculatedvalueshallbe
roundedasindicatedinaccordancewiththeroundingmethod
ofPractice
E29.
PropertyRoundedUnitforObservedor
CalculatedValue
Nearestunitinthelastright-hand
significantdigitusedinexpressing
thelimitingvalue
Chemicalcomposition
Electricalresist.
Grainsize
Upto0.055mm,incl.
Over0.055to160mm
21.1.3Incaseofdissatisfactionwithresultsofthetestupon
whichrejectionisbased,themanufacturer,orsupplier,may
makeclaimforarehearing.
21.2Rehearing—Asaresultofproductrejection,themanu-
facturer,orsupplier,maymakeclaimforaretesttobe
conductedbythemanufacturer,orsupplier,andthepurchaser.
Samplesoftherejectedproductshallbetakeninaccordance
withthisspecificationandsubjectedtotestbybothparties
usingthetestmethod(s)specifiedhereinor,alternatively,upon
agreementbybothparties,anindependentlaboratorymaybe
selectedforthetest(s)usingthetestmethodsspecifiedinthis
productspecification.
fication
22.1Whenspecifiedinthecontractorpurchaseorder,the
purchasershallbefurnishedcertificationthatsamplesrepre-
sentingeachlothavebeentestedorinspectedasdirectedinthis
specificationandtherequirementshavebeenmet.
stReport
23.1Whenspecifiedinthecontractorpurchaseorder,a
reportofthetestresultsshallbefurnished.
ingandPackageMarking
24.1Packaging:
24.1.1Theproductshallbeseparatedbyshape,sizeand
temperandpreparedforshipmentinsuchamannerastoafford
protectionfromthenormalhazardsoftransportation.
24.1.2Specialpackingorpackagingrequiredshallbeby
agreementbetweenthemanufacturerorsupplierandthe
purchaseratthetimeofthecontractorpurchaseorder.
24.2PackageMarking—Eachshippingunitshallbelegibly
markedwiththepurchaseordernumber,metaldesignation,
temper,size,shape,grossandnetweight,andthenameofthe
cificationnumbersshallalsobeshownwhen
sospecifiedinthecontractorpurchaseorder.
ds
25.1oxygen-freecopper;oxygen-freecopperforelectron
devices;wroughtcopperformsforelectrondevices;wrought
oxygen-freecopperforelectrondevices
nearestmultiple0.005mm
nearest0.01mm
tion
20.1Themanufacturershallinspectandmaketestsneces-
sarytoverifythattheproductfurnishedconformstothe
requirementsprescribedinthebasicproductspecificationto
whichtheproductwasorderedandtherequirementsofthis
specification.
20.2Sourceinspectionoftheproductbythepurchasermay
beagreeduponbetweenthemanufacturerorsupplierandthe
purchaseraspartofthecontractorpurchaseorder.
20.2.1Thenatureofthefacilitiesneededtosatisfythe
inspectorrepresentingthepurchaserthattheproductbeing
furnishedisinaccordancewiththeproductspecificationshall
beincludedintheagreement.
20.2.2Alltestsandinspectionshallbeconductedsoasnot
tointerfereunnecessarilywiththeoperationsoftheworks.
20.3Themanufacturerorsuppliermayaccomplishthefinal
inspectionsimultaneouslybymutualagreement.
ionandRehearing
21.1Rejection:
21.1.1Productwhichfailstoconformtotherequirements
ofthisspecificationwheninspectedortestedbythepurchaser,
orthepurchaser’sagent,mayberejected.
21.1.2Rejectionshallbereportedtothemanufactureror
supplier,promptly,andinwriting.
5
F68–05
SUMMARYOFCHANGES
CommitteeB05hasidentifiedthelocationofselectedchangestothisstandardsincethelastissue
(F68–99(2004))thatmayimpacttheuseofthisstandard.(ApprovedOct.1,2005.)
(1)InSection17,onemayeitherrapidlycoolthesamplesby
quenchinginwaterorcoolusingthesameatmosphereasthe
pliestoparagraphs17.5.2,17.6.1.5,17.6.2.2,
17.6.3.3,and17.6.4.3.
(2)Thescalingtestforoxideadherenceasdescribedin
paragraph
8.2shallbeuponagreementbetweencustomerand
supplieraswilltheacceptancecriteria.
ASTMInternationaltakesnopositionrespectingthevalidityofanypatentrightsassertedinconnectionwithanyitemmentioned
fthisstandardareexpresslyadvisedthatdeterminationofthevalidityofanysuchpatentrights,andtherisk
ofinfringementofsuchrights,areentirelytheirownresponsibility.
Thisstandardissubjecttorevisionatanytimebytheresponsibletechnicalcommitteeandmustbereviewedeveryfiveyearsand
ifnotrevised,mmentsareinvitedeitherforrevisionofthisstandardorforadditionalstandards
mmentswillreceivecarefulconsiderationatameetingofthe
responsibletechnicalcommittee,eelthatyourcommentshavenotreceivedafairhearingyoushould
makeyourviewsknowntotheASTMCommitteeonStandards,attheaddressshownbelow.
ThisstandardiscopyrightedbyASTMInternational,100BarrHarborDrive,POBoxC700,WestConshohocken,PA19428-2959,
dualreprints(singleormultiplecopies)ofthisstandardmaybeobtainedbycontactingASTMattheabove
addressorat610-832-9585(phone),610-832-9555(fax),orservice@(e-mail);orthroughtheASTMwebsite
().
6
2024年3月28日发(作者：户迎天)
Designation:F68–05
StandardSpecificationfor
Oxygen-FreeCopperinWroughtFormsforElectron
Devices
1
ThisstandardisissuedunderthefixeddesignationF68;thenumberimmediatelyfollowingthedesignationindicatestheyearoforiginal
adoptionor,inthecaseofrevision,script
epsilon(e)indicatesaneditorialchangesincethelastrevisionorreapproval.
*
1.1Thisspecificationestablishestherequirementsfor
wroughtandfabricatedshapesmadefromCopperUNS
2
No.
C10100,conformingtothechemicalrequirementsofSpecifi-
cationB170,Grade1,andsuitableforuseinelectrondevices.
1.2Therequirementsofthisspecificationareinadditionto
thoseprescribedinthefollowingproductspecificationsappro-
priatetothematerialbeingordered:B1,B2,B75,B75M,
B152/B152M,B170,B187/B187M,B272,
caseofconflict,however,thisspecificationshalltakeprece-
dence.
1.3Theinch-poundunitsarethestandardforthisspecifi-
valuesgiveninparenthesesareforinformationonly.
1.4Thefollowingsafetyhazardcaveatappliestosections
17.4,17.5and18.7ofthisspecification:Thisstandarddoesnot
purporttoaddressallofthesafetyconcerns,ifany,associated
eresponsibilityoftheuserofthisstandard
toestablishappropriatesafetyandhealthpracticesand
determinetheapplicabilityofregulatorylimitationspriorto
use.
ncedDocuments
2.1ASTMStandards:
3
B1SpecificationforHard-DrawnCopperWire
B2SpecificationforMedium-Hard-DrawnCopperWire
B3SpecificationforSoftorAnnealedCopperWire
B75SpecificationforSeamlessCopperTube
B75MSpecificationforSeamlessCopperTube(Metric)
ThisspecificationisunderthejurisdictionofASTMCommitteeB05onCopper
andCopperAlloysandisthedirectresponsibilityofSubcommitteeB05.02onRod,
Bar,Wire,Shapes,andForgings.
CurrenteditionapprovedOct.1,ally
eviouseditionapprovedin2004asF68–99(2004).
2
TheUNSSystemforcopperandcopperalloys(seePracticeE527)isasimple
expansionoftheformerstandarddesignationsystemaccomplishedbytheaddition
ofaprefix“C”andasuffix“00”.Thesuffixcanbeusedtoaccommodate
compositionvariationsofthebasealloy.
3
ForreferencedASTMstandards,visittheASTMwebsite,,or
contactASTMCustomerServiceatservice@ualBookofASTM
Standardsvolumeinformation,refertothestandard’sDocumentSummarypageon
theASTMwebsite.
1
B152/B152MSpecificationforCopperSheet,Strip,Plate
andRolledBar
B170SpecificationforOxygen-FreeElectrolyticCopper—
RefineryShapes
B187/B187MSpecificationforCopperBar,BusBar,Rod
andShapes
B188SpecificationforSeamlessCopperBusPipeand
Tube
B193TestMethodforResistivityofElectricalConductor
Materials
B248SpecificationforGeneralRequirementsforWrought
CopperandCopper-AlloyPlate,Sheet,StripandRolled
Bar
B248MSpecificationforGeneralRequirementsfor
WroughtCopperandCopper-AlloyPlate,Sheet,Stripand
RolledBar[Metric]
B249/B249MSpecificationforGeneralRequirementsfor
WroughtCopperandCopper-AlloyRod,Bar,Shapes,and
Forgings
B250/B250MSpecificationforGeneralRequirementsfor
WroughtCopper-AlloyWire
B272SpecificationforCopperFlatProductswithFinished
(RolledorDrawn)Edges(FlatWireandStrip)
B372SpecificationforSeamlessCopperandCopper-Alloy
RectangularWaveguideTube
B577TestMethodsforDetectionofCuprousOxideHy-
drogenEmbrittlementSusceptibilityinCopper
E29PracticeforUsingSignificantDigitsinTestDatato
DetermineConformancewithSpecifications
E112TestMethodsforDeterminingAverageGrainSizes
E527PracticeforNumberingMetalsandAlloys(UNS)
2.2ASTMAdjunct:
ComparisonChart
4
ology
3.1Fordefinitionsoftermsrelatedtothisproduct,referto
theterminologysectionsofSpecifications
B3,B188,B248,
B248M,B249/B249M,B250/B250M,orB251.
djunctNo.
ADJF0068.
4
*ASummaryofChangessectionappearsattheendofthisstandard.
Copyright©ASTMInternational,100BarrHarborDrive,POBoxC700,WestConshohocken,PA19428-2959,UnitedStates.
1
F68–05
3.2DefinitionofTermsSpecifictoThisStandard:
3.2.1extrusionpipe,n—alaminationresultingfromthe
flowoftheoxidesurfaceofabilletintothearticlebeing
extrudedandusuallyconfinedtothetrailing-endportionofthe
extrudedproduct.
3.2.2oxygen-free,adj—electrolyticcopperproducedsub-
stantiallyfreeofcuprousoxideandcontainingnomorethan10
ppmoxygen,asdeterminedbymetallographicexaminationat
753underpolarizedlight,andmanufacturedwithouttheuse
ofmetallicormetalloidaldeoxidizers.
3.2.3oxygen-free,grade1,adj—asdefinedin
3.2.2except
pper
isalsocommonlytermed“oxygen-freeelectronic.”
3.2.4rms,n—root-mean-square,astatisticalmeasureof
surfaceroughnessusuallydeterminedbymeansofaprofilo-
meter.
ngInformation
4.1Ordersfortheproductshallincludethefollowing
information:
4.1.1ThedesignationandyearofissueofbothSpecifica-
tionF68andthebasicproductspecificationinvolved,
4.1.2Shapeofproduct,
4.1.3Size,
4.1.4Totalestimatedweightornumberofpieces,orboth,
foreachsizeandshape,
4.1.5TheSpecificationF68Classofmaterial,
4.1.6Intendedapplication(forexample,waveguide),
4.1.7Temper,
4.1.8Heatidentificationortraceabilitydetails,
4.1.9Certification,
4.2Thefollowingoptionsareavailable:
4.2.1Milltestreport,
4.2.2Specialpackaging,
4.2.3Specialmarking.
alsandManufacture
5.1Material—Thematerialshallbeoxygen-freeelectronic
copperwhichconformstotherequirementsofSpecification
B170,Grade1.
5.2Manufacture—Themanufacturingprocessshallcon-
formtotherequirementsofthisspecificationandtothebasic
productspecificationtowhichtheproductwasordered.
alComposition
6.1Thecastrefineryshapeshallconformtotherequire-
mentsspecifiedinSpecification
B170,Grade1,Table1.
6.1.1Coppershallbetakenasthedifferencebetweenthe
sumofresultsforGrade1specifiedelementsand100%.
6.2Thesecompositionlimitsdonotprecludethepossible
maybeestab-
lishedandanalysisrequiredforunnamedelementsbyagree-
mentbetweenthemanufacturerandthepurchaser.
7.1Thetemperofthewroughtorfabricatedproductsup-
pliedshallconformtotherequirementsofthebasicproduct
specificationtowhichitwasordered.
2
alProperties
8.1ElectricalResistivity—Themaximummassresistivity
shallbe0.15176ohmsg/m
2
(conductivity101.0%minimum,
InternationalAnnealedCopperStandard(IACS)at20°Cwhen
testedintheannealedcondition.
8.2Scaling—Whenagreeduponbetweencustomerand
supplier,thetestspecimensofoxygen-freecoppershallshow
substantialsurfaceoxideadherencewhensubjectedtotestas
describedin
18.7.
N
OTE
1—Thepurposeofthistestistodistinguishbetweenoxygenfree
izedcopperwillnotretainthesurface
oxideinthistest.
icalProperties
9.1Allproductsshallconformtothemechanicalproperty
requirementsofthebasicproductspecificationtowhichthe
itemwasordered,withthefollowingexception:
and
intendedforgasketsorfordeepdrawingshallconformtothe
requirementsprescribedinTable1.
enEmbrittlement(ReverseBendTest
Method)
10.1Specimensshallwithstandaminimumoftenreverse
ceofblisters,uponvisual
examination,shallbecauseforrejection.
N
OTE
2—Fracturedareasofthebentsamplesshouldshowsome
reductioninareaandhaveadistorted,albreak
willhavetheappearanceofacupandconetensilefailure.
lExamination
11.1Whenexaminedthesamplesshallhave:
11.1.1Arelativelyuniformsurfacefreeofirregularrough
spotssometimestermedopengrains,
11.1.2Edgesfreeofseams,lapsandcracks,
11.1.3Crosssectionsfreeofbreaks,inclusionsorextrusion
pipe.
lExaminations
12.1SpecialMacroExamination:
12.1.1Thesamplesshallshownosubsurfacedefectsin
excessofthefollowinglimits:
12.1.1.1TubularProducts:
(1)TubesforExhaust(Pinch-off)Purposes:
(a)Forwallthicknessover0.1in.(2.5mm),nodefects
ontheexternalsurfacedeeperthan0.005in.(0.13mm).
(b)Forwallthicknessesupto0.1(2.5mm)inclusive,no
defectsontheexternalsurfacedeeperthan5%ofthewall
thickness.
(c)Nosignificantdefectsontheinsidesurfacewhen
examinedwithfiberopticsoraboroscope.
TABLE1GrainSize
Thickness
Lessthan0.040in.(1.0mm)
0.040to0.125in.(1.0to3.2mm)
A
AverageGrain
Size,
max,mm
0.035
0.050
Hardness
HRF
A
max
75
75
Forinformationonly.
F68–05
(2)Waveguides—Nodefectsontheexternalsurfacedeeper
than0.005in.(0.13mm)or5%ofthewallthickness,
ificantdefectsontheinside
surfacewhenexaminedwithfiberopticsoraboroscope.
(3)TubeforOtherApplications—Nodefectsoneitherthe
internalorexternalsurfacesdeeperthan0.020in.(0.51mm)or
5%ofthewallthickness,whicheveristhesmaller.
12.1.1.2BarandPlateProducts—Nodefectsdeeperthan
0.06in.(1.6mm)or5%ofthethickness,whicheveristhe
smaller.
12.1.1.3Sheet,StripandFlatWireProducts—Nodefects
deeperthan0.005in.(0.13mm)or5%ofthethickness,
whicheverissmaller.
12.1.1.4RodandWireProducts:
(1)RodandWirelessthan0.19in.(4.8mm)in
Diameter—Nodefectsdeeperthan0.005in.(0.13mm)or5%
ofthediameter,whicheverissmaller.
(2)RodandWire0.19in.(4.8mm)andOverin
Diameter—Nodefectsdeeperthan0.06in.(1.6mm)or5%of
thediameter,whicheverissmaller.
12.2SpecialMicroscopicalExamination:
12.2.1SamplesshallbeclassifiedbycomparisontoPlate1,
whichisavailablefromASTMInternationalHeadquartersas
anadjunct(see
2.2).
12.2.1.1Productwhosesampleshaveanappearancein
conformingtoeitherClass1orClass2shallbeconsidered
acceptable.
12.2.1.2Subsurfacemicroporositysimilartothosetypical
ofClass3,4or5asillustratedinPlate1,arepermissiblein
Class1and2materialprovidedthemicroporositydoesnot
appearbelowthemetalsurfaceatdepthsexceedingthe
following:
(1)TubularProducts:
(a)TubesforExhaustPurposesandWaveguides—No
indicationsatanydepthbelowthesurface.
(b)TubesforOtherApplications—Microporositypermis-
sibletodepthsof0.020in.(0.51mm)or5%ofthetubewall,
whicheverissmaller.
(2)BarandPlate—Microporositypermissibletodepthsof
0.06in.(1.5mm)or5%ofthethickness,whicheverissmaller.
(3)Sheet,StripandFlatWire—Microporositypermissible
todepthsof0.010in.(0.25mm)or5%ofthethickness,
whicheverissmaller.
(4)RodandWireProducts:
(a)RodandWirelessthan0.19in.(4.8mm)in
Diameter—Microporositypermissibletodepthsof0.010in.
(0.25mm)or5%ofthediameterorthickness,whicheveris
smaller.
(b)RodandWire0.19in.(4.8mm)andOverin
Diameter—Microporositypermissibletodepthsof0.06in.
(1.5mm)or5%ofthediameterorthickness,whicheveristhe
smaller.
12.2.1.3Productwhosesampleshaveanappearancecorre-
spondingtoClass3,4or5andnotinconformancewith
12.2.1.2,shallbeacceptableonlybyagreementbetweenthe
manufacturerorsupplierandthepurchaser.
3
ions,MassandPermissibleVariations
13.1Thedimensionaltolerancesfortheproductdescribed
bythisspecificationshallbeasprescribedinthebasicproduct
specificationtowhichitwasordered.
nship,FinishandAppearance
14.1Theproductshallbepreparedandhandledinsucha
mannerastobesubstantiallyfreefromsurfaceoxideandthe
presenceofforeignmaterialsuchasmetalchips,dirtand
grease.
ng
15.1Thesamplingpracticeshallbeasprescribedinthe
basicproductspecificationtowhichitwasordered.
15.1.1Thenumberofsamplepiecestobeselected,how-
ever,shallbetwicethenumberprescribedinthebasicproduct
specification.
ofTestsandRetests
16.1Tests—Thenumberofsamplessubmittedtoalltests
shallbetwicethatrequiredbythebasicproductspecification
towhichtheproductwasordered.
16.2Retests:
16.2.1Retestsarepermittedasstatedinthebasicproduct
specificationtowhichtheproductwasorderedfortests
associatedwiththebasicproductspecification.
16.2.2Retestsshallbepermittedfortestsandexaminations
requiredbythisspecification.
16.2.3Productswhichfailinretestshallberejected.
enPreparation
17.1ChemicalComposition—Analyticalsampleprepara-
tionshallbeasdirectedinthebasicproductspecificationto
whichtheproductwasordered.
17.2ElectricalResistivity—Specimenpreparationshallbe
asdirectedinthebasicproductspecificationtowhichthe
productwasordered.
17.3GrainSize—Specimenpreparationshallbeasdirected
inthebasicproductspecificationtowhichtheproductwas
ordered.
17.4GeneralandSpecialMacroExamination:
17.4.1Transversesectionsofthesamplesshallbemachined
toa63rmsorsmoothersurfacefinishanddegreased.
17.4.1.1Inaproperlyventilatedfumehood,etchthe
samplesfor3to5minbyloweringthesamplesintoafreshly
preparedetchingsolutionandslowlyagitate.
17.4.1.2Preparetheetchingsolutionbymixingequalparts
ofconcentratedreagentgradenitricacid(HNO
3
)anddeionized
5gramsofcopperforeachliterofthe
50%acidsolutionandcoolthesolutiontoambienttempera-
utionshallbekeptfreeofdirtand
maintainedat7565°F(2463°C)duringuse.
(Warning—Donotpourthewaterintotheacid.)
17.4.1.3Removethesamplesperiodicallyfromtheetching
solutionandvisuallyexaminetodeterminewhethersufficiently
thesamplestendtostain,add25mLof
concentratedreagentgradehydrochloricacid(HCl)toeach
literofetchingsolution.
F68–05
17.4.1.4Afteretching,rinsethesamplesthoroughlywith
deionizedordistilledwaterandblowdrywithairforexami-
nation.
17.5SpecialMicroscopicalExamination:
17.5.1Cutanddegreaselongitudinalsamplestakenfrom
thefinishedproduct.
17.5.2Heatthesamplesto1870640°F(1020620°C)and
holdattemperaturefor30mininanatmospherecomprising
notlessthan10%ycooltoambienttempera-
turebyquenchinginwaterwithoutundueexposuretoairor
quicklycoolthespecimensinthesameatmosphere.
17.5.3Polishandetchforexaminationusingtheetching
solutiondescribedin
Table2.(Warning—Withconstantgentle
stirringorswirlingofthewater,
pourthewaterintotheacid.)
17.6HydrogenEmbrittlement(ReverseBendTest
Method)—SamplepreparationshallbeinaccordancewithTest
SpecimensSectionofTestMethodsB577.
17.6.1TubularProducts:
17.6.1.1Fortubewithanoutsidediameterof0.12in.(3
mm)orless,thesamplesshallbeflattenedbypressingor
rolling.
17.6.1.2Fortubewithanoutsidediametergreaterthan0.12
in.(3mm)butlessthan1in.(25.4mm)thesamplesshallbe
cutlongitudinallyfromthetubeandflattened,whennecessary
byeitherpressingorrolling.
17.6.1.3Fortubewithanoutsidediameterof1in.(25.4
mm)andgreater,samplesmaybecuteitherparallelor
transversetotheaxisofthetubeandthenflattened.
17.6.1.4Shouldthethicknessofanyflattenedsamplebe
greaterthan0.081in.(2.06mm),itshallbemachinedtoa
thicknessof0.08160.001in.(2.0660.025mm)andatleast
oneoftheoriginalsurfacesofthefinishedtubeshallbe
retainedononeofthesamples.
17.6.1.5Samplesshallbeheatedto1560640°F
(850620°C)andheldatthattemperatureforaperiodof30
mininanatmospherecontainingnotlessthan10%hydrogen
andthenrapidlycooledbyquenchinginambienttemperature
waterwithoutundueexposuretoairorquicklycoolthe
specimensinthesameatmosphere.
17.6.2BarandPlateProducts:
17.6.2.1Samplesshallbemachinedtoathicknessof
0.08160.001in.(2.0660.025mm)andatleastoneofthe
originalsurfacesofthefinishedproductshallberetainedon
oneofthesamples.
17.6.2.2Samplesshallbeheatedto1560640°F
(850620°C)andheldatthattemperatureforaperiodof30
mininanatmospherecontainingnotlessthan10%hydrogen
andthenrapidlycooledbyquenchinginambienttemperature
waterwithoutundueexposuretoairorquicklycoolthe
specimensinthesameatmosphere.
17.6.3Sheet,StripandFlatWireProducts:
TABLE2EtchingSolution
SodiumDichromate
SodiumChloride
SulfuricAcid(Conc.)
Water(deionizedordistilled)
16grams
12grams
64mL
100mL
17.6.3.1Forproductswithathicknessof0.081in.(2.06
mm)orless,thesamplesshallbepreparedwithoutmachining.
17.6.3.2Forproductswithathicknessgreaterthan0.081in.
(2.06mm),thesamplesshallbemachinedtoathicknessof
0.08160.001in.(2.0660.025mm)andatleastoneofthe
originalsurfacesofthefinishedproductshallberetainedon
oneofthesamples.
17.6.3.3Samplesshallbeheatedto1560640°F
(850620°C)andheldatthattemperatureforaperiodof30
mininanatmospherecontainingnotlessthan10%hydrogen
andthenrapidlycooledbyquenchinginambienttemperature
waterwithoutundueexposuretoairorquicklycoolthe
specimensinthesameatmosphere.
17.6.4RodandWireProducts:
17.6.4.1Forproductswithadiameterorthicknessof0.081
in.(2.06mm)andunderthesampleshallbepreparedwithout
machining.
17.6.4.2Forproductswithadiameterorthicknessgreater
than0.081in.(2.06mm)thesamplesshallbemachinedtoa
thicknessof0.08160.001in.(2.0660.025mm)andatleast
oneoftheoriginalsurfacesofthefinishedproductshallbe
retainedononeofthesamples.
17.6.4.3Samplesshallbeheatedto1560640°F
(850620°C)andheldatthattemperatureforaperiodof30
mininanatmospherecontainingnotlessthan10%hydrogen
andthenrapidlycooledbyquenchinginambienttemperature
waterwithoutundueexposuretoairorquicklycoolthe
specimensinthesameatmosphere.
thods
18.1ChemicalComposition:
18.1.1Thetestmethodsusedforthedeterminationof
compositionshallbeasspecifiedinthebasicproductspecifi-
cationtowhichthematerialwasordered.
18.1.2Thetestmethod(s)usedforthedeterminationof
elementsrequiredbycontractualorpurchaseorderagreement
shallbeasagreeduponbetweenthemanufacturerorsupplier
andthepurchaser.
18.2GrainSize—Grainsizeshallbedeterminedinaccor-
dancewithTestMethods
ofdispute,the
interceptmethodshallbeused.
18.3ElectricalResistivity—Electricalresistivityshallbe
determinedinaccordancewithTestMethods
e-
mentuncertaintyshallnotexceed60.15%.
18.4GeneralExaminationandSpecialMacro
Examination—Examinationshallbevisuallywiththeunaided
eyeorat103magnification.
18.5SpecialMicroscopicalExamination—Examination
shallbemadeat1003magnificationandclassifiedbycom-
parisontoPlate1.
18.6HydrogenEmbrittlementSusceptibility(ReverseBend
TestMethod)—Hydrogenembrittlementshallbedeterminedin
accordancewithTestMethodDofTestMethodsB577.
18.7ScalingTest—Thesamplesshallbeheatedinairina
cleanmufflefurnacefor30minat1560640°F(850620°C)
andimmediatelyquenchedinclean,ambienttemperature
ancecriteriatobebyagreementbetweencus-
tomerandsupplier.
4
F68–05
ficanceofNumericalLimits
19.1Forthepurposeofdeterminingcompliancewithspeci-
fiedlimitsanobservedvalueorcalculatedvalueshallbe
roundedasindicatedinaccordancewiththeroundingmethod
ofPractice
E29.
PropertyRoundedUnitforObservedor
CalculatedValue
Nearestunitinthelastright-hand
significantdigitusedinexpressing
thelimitingvalue
Chemicalcomposition
Electricalresist.
Grainsize
Upto0.055mm,incl.
Over0.055to160mm
21.1.3Incaseofdissatisfactionwithresultsofthetestupon
whichrejectionisbased,themanufacturer,orsupplier,may
makeclaimforarehearing.
21.2Rehearing—Asaresultofproductrejection,themanu-
facturer,orsupplier,maymakeclaimforaretesttobe
conductedbythemanufacturer,orsupplier,andthepurchaser.
Samplesoftherejectedproductshallbetakeninaccordance
withthisspecificationandsubjectedtotestbybothparties
usingthetestmethod(s)specifiedhereinor,alternatively,upon
agreementbybothparties,anindependentlaboratorymaybe
selectedforthetest(s)usingthetestmethodsspecifiedinthis
productspecification.
fication
22.1Whenspecifiedinthecontractorpurchaseorder,the
purchasershallbefurnishedcertificationthatsamplesrepre-
sentingeachlothavebeentestedorinspectedasdirectedinthis
specificationandtherequirementshavebeenmet.
stReport
23.1Whenspecifiedinthecontractorpurchaseorder,a
reportofthetestresultsshallbefurnished.
ingandPackageMarking
24.1Packaging:
24.1.1Theproductshallbeseparatedbyshape,sizeand
temperandpreparedforshipmentinsuchamannerastoafford
protectionfromthenormalhazardsoftransportation.
24.1.2Specialpackingorpackagingrequiredshallbeby
agreementbetweenthemanufacturerorsupplierandthe
purchaseratthetimeofthecontractorpurchaseorder.
24.2PackageMarking—Eachshippingunitshallbelegibly
markedwiththepurchaseordernumber,metaldesignation,
temper,size,shape,grossandnetweight,andthenameofthe
cificationnumbersshallalsobeshownwhen
sospecifiedinthecontractorpurchaseorder.
ds
25.1oxygen-freecopper;oxygen-freecopperforelectron
devices;wroughtcopperformsforelectrondevices;wrought
oxygen-freecopperforelectrondevices
nearestmultiple0.005mm
nearest0.01mm
tion
20.1Themanufacturershallinspectandmaketestsneces-
sarytoverifythattheproductfurnishedconformstothe
requirementsprescribedinthebasicproductspecificationto
whichtheproductwasorderedandtherequirementsofthis
specification.
20.2Sourceinspectionoftheproductbythepurchasermay
beagreeduponbetweenthemanufacturerorsupplierandthe
purchaseraspartofthecontractorpurchaseorder.
20.2.1Thenatureofthefacilitiesneededtosatisfythe
inspectorrepresentingthepurchaserthattheproductbeing
furnishedisinaccordancewiththeproductspecificationshall
beincludedintheagreement.
20.2.2Alltestsandinspectionshallbeconductedsoasnot
tointerfereunnecessarilywiththeoperationsoftheworks.
20.3Themanufacturerorsuppliermayaccomplishthefinal
inspectionsimultaneouslybymutualagreement.
ionandRehearing
21.1Rejection:
21.1.1Productwhichfailstoconformtotherequirements
ofthisspecificationwheninspectedortestedbythepurchaser,
orthepurchaser’sagent,mayberejected.
21.1.2Rejectionshallbereportedtothemanufactureror
supplier,promptly,andinwriting.
5
F68–05
SUMMARYOFCHANGES
CommitteeB05hasidentifiedthelocationofselectedchangestothisstandardsincethelastissue
(F68–99(2004))thatmayimpacttheuseofthisstandard.(ApprovedOct.1,2005.)
(1)InSection17,onemayeitherrapidlycoolthesamplesby
quenchinginwaterorcoolusingthesameatmosphereasthe
pliestoparagraphs17.5.2,17.6.1.5,17.6.2.2,
17.6.3.3,and17.6.4.3.
(2)Thescalingtestforoxideadherenceasdescribedin
paragraph
8.2shallbeuponagreementbetweencustomerand
supplieraswilltheacceptancecriteria.
ASTMInternationaltakesnopositionrespectingthevalidityofanypatentrightsassertedinconnectionwithanyitemmentioned
fthisstandardareexpresslyadvisedthatdeterminationofthevalidityofanysuchpatentrights,andtherisk
ofinfringementofsuchrights,areentirelytheirownresponsibility.
Thisstandardissubjecttorevisionatanytimebytheresponsibletechnicalcommitteeandmustbereviewedeveryfiveyearsand
ifnotrevised,mmentsareinvitedeitherforrevisionofthisstandardorforadditionalstandards
mmentswillreceivecarefulconsiderationatameetingofthe
responsibletechnicalcommittee,eelthatyourcommentshavenotreceivedafairhearingyoushould
makeyourviewsknowntotheASTMCommitteeonStandards,attheaddressshownbelow.
ThisstandardiscopyrightedbyASTMInternational,100BarrHarborDrive,POBoxC700,WestConshohocken,PA19428-2959,
dualreprints(singleormultiplecopies)ofthisstandardmaybeobtainedbycontactingASTMattheabove
addressorat610-832-9585(phone),610-832-9555(fax),orservice@(e-mail);orthroughtheASTMwebsite
().
6