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2SA1162中文资料

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2024年4月3日发(作者:伦浩荡)

2SA1162

TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process)

2SA1162

= 0.95 (typ.)

Unit: mm

Audio Frequency General Purpose Amplifier Applications

• High voltage and high current: V

CEO

= −50 V, I

C

= −150 mA (max)

• Excellent h

FE

linearity: h

FE

(I

C

= −0.1 mA)/h

FE

(I

C

= −2 mA)

• High h

FE:

h

FE

= 70~400

• Low noise: NF = 1dB (typ.), 10dB (max)

• Complementary to 2SC2712

• Small package

Absolute Maximum Ratings

(Ta

=

25°C)

Characteristics Symbol Rating Unit

Collector-base voltage

Collector-emitter voltage

Emitter-base voltage

Collector current

Base current

Collector power dissipation

Junction temperature

Storage temperature range

V

CBO

V

CEO

V

EBO

I

C

I

B

T

j

T

stg

−50 V

−50 V

−5 V

−150 mA

−30 mA

125 °C

−55~125 °C

P

C

150 mW

JEDEC TO-236MOD

Electrical Characteristics

(Ta

=

25°C)

Characteristics Symbol Test Condition Min Typ. MaxUnit

Collector cut-off current

Emitter cut-off current

DC current gain

Collector-emitter saturation voltage

Transition frequency

Collector output capacitance

Noise figure

I

CBO

I

EBO

h

FE

(Note)

V

CE (sat)

f

T

C

ob

NF

V

CB

= −50 V, I

E

= 0

V

EB

= −5 V, I

C

= 0

V

CE

= −6 V, I

C

= −2 mA

I

C

= −100 mA, I

B

= −10 mA

V

CE

= −10 V, I

C

= −1 mA

V

CB

= −10 V, I

E

= 0, f = 1 MHz

V

CE

= −6 V, I

C

= −0.1 mA, f = 1 kHz,

Rg = 10 kΩ,

70

80

−0.1

−0.1

μA

μA

V

Note: Using continuously under heavy loads (e.g. the application of high

JEITA SC-59

temperature/current/voltage and the significant change in

TOSHIBA 2-3F1A

temperature, etc.) may cause this product to decrease in the

reliability significantly even if the operating conditions (i.e.

Weight: 0.012 g (typ.)

operating temperature/current/voltage, etc.) are within the

absolute maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

⎯ 400

−0.1

−0.3

⎯ MHz

⎯ 4 7 pF

⎯ 1.0 10 dB

Note: h

FE

classification O (O): 70~140, Y (Y): 120~240, GR (G): 200~400, ( ) marking symbol

Marking

1

2007-11-01

2SA1162

2

2007-11-01

2SA1162

RESTRICTIONS ON PRODUCT USE

• The information contained herein is subject to change without notice.

20070701-EN GENERAL

• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor

devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical

stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of

safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of

such TOSHIBA products could cause loss of human life, bodily injury or damage to property.

In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as

set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and

conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability

Handbook” etc.

• The TOSHIBA products listed in this document are intended for usage in general electronics applications

(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,

etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires

extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or

bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or

spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,

medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his

document shall be made at the customer’s own risk.

• The products described in this document shall not be used or embedded to any downstream products of which

manufacture, use and/or sale are prohibited under any applicable laws and regulations.

• The information contained herein is presented only as a guide for the applications of our products. No

responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which

may result from its use. No license is granted by implication or otherwise under any patents or other rights of

TOSHIBA or the third parties.

• Please contact your sales representative for product-by-product details in this document regarding RoHS

compatibility. Please use these products in this document in compliance with all applicable laws and regulations

that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses

occurring as a result of noncompliance with applicable laws and regulations.

3

2007-11-01

2024年4月3日发(作者:伦浩荡)

2SA1162

TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process)

2SA1162

= 0.95 (typ.)

Unit: mm

Audio Frequency General Purpose Amplifier Applications

• High voltage and high current: V

CEO

= −50 V, I

C

= −150 mA (max)

• Excellent h

FE

linearity: h

FE

(I

C

= −0.1 mA)/h

FE

(I

C

= −2 mA)

• High h

FE:

h

FE

= 70~400

• Low noise: NF = 1dB (typ.), 10dB (max)

• Complementary to 2SC2712

• Small package

Absolute Maximum Ratings

(Ta

=

25°C)

Characteristics Symbol Rating Unit

Collector-base voltage

Collector-emitter voltage

Emitter-base voltage

Collector current

Base current

Collector power dissipation

Junction temperature

Storage temperature range

V

CBO

V

CEO

V

EBO

I

C

I

B

T

j

T

stg

−50 V

−50 V

−5 V

−150 mA

−30 mA

125 °C

−55~125 °C

P

C

150 mW

JEDEC TO-236MOD

Electrical Characteristics

(Ta

=

25°C)

Characteristics Symbol Test Condition Min Typ. MaxUnit

Collector cut-off current

Emitter cut-off current

DC current gain

Collector-emitter saturation voltage

Transition frequency

Collector output capacitance

Noise figure

I

CBO

I

EBO

h

FE

(Note)

V

CE (sat)

f

T

C

ob

NF

V

CB

= −50 V, I

E

= 0

V

EB

= −5 V, I

C

= 0

V

CE

= −6 V, I

C

= −2 mA

I

C

= −100 mA, I

B

= −10 mA

V

CE

= −10 V, I

C

= −1 mA

V

CB

= −10 V, I

E

= 0, f = 1 MHz

V

CE

= −6 V, I

C

= −0.1 mA, f = 1 kHz,

Rg = 10 kΩ,

70

80

−0.1

−0.1

μA

μA

V

Note: Using continuously under heavy loads (e.g. the application of high

JEITA SC-59

temperature/current/voltage and the significant change in

TOSHIBA 2-3F1A

temperature, etc.) may cause this product to decrease in the

reliability significantly even if the operating conditions (i.e.

Weight: 0.012 g (typ.)

operating temperature/current/voltage, etc.) are within the

absolute maximum ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

⎯ 400

−0.1

−0.3

⎯ MHz

⎯ 4 7 pF

⎯ 1.0 10 dB

Note: h

FE

classification O (O): 70~140, Y (Y): 120~240, GR (G): 200~400, ( ) marking symbol

Marking

1

2007-11-01

2SA1162

2

2007-11-01

2SA1162

RESTRICTIONS ON PRODUCT USE

• The information contained herein is subject to change without notice.

20070701-EN GENERAL

• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor

devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical

stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of

safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of

such TOSHIBA products could cause loss of human life, bodily injury or damage to property.

In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as

set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and

conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability

Handbook” etc.

• The TOSHIBA products listed in this document are intended for usage in general electronics applications

(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,

etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires

extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or

bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or

spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,

medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his

document shall be made at the customer’s own risk.

• The products described in this document shall not be used or embedded to any downstream products of which

manufacture, use and/or sale are prohibited under any applicable laws and regulations.

• The information contained herein is presented only as a guide for the applications of our products. No

responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which

may result from its use. No license is granted by implication or otherwise under any patents or other rights of

TOSHIBA or the third parties.

• Please contact your sales representative for product-by-product details in this document regarding RoHS

compatibility. Please use these products in this document in compliance with all applicable laws and regulations

that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses

occurring as a result of noncompliance with applicable laws and regulations.

3

2007-11-01

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