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Fairchild QRE1113和QRE1113GR微型反射物体传感器数据手册说明书_百

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2024年7月31日发(作者:经禹)

QRE1113, QRE1113GR — Minature Reflective Object Sensor

September 2009

QRE1113, QRE1113GR

Minature Reflective Object Sensor

Features

Phototransistor output

No contact surface sensing

Miniature package

Lead form style: Gull Wing

Two leadform options:Through hole (QRE1113)

SMT gullwing (QRE1113GR)

Two packaging options:Tube (QRE1113)

Tape and reel (QRE1113GR)

QRE1113GR Package Dimensions

2.90

2.50

1.00

4

3

0.94

C

L

0.60

0.40

1.80

C

L

3.60

3.20

0.94

12

30°

0.40

1.70

1.50

0.61 Nom.

(4x)

4.80

4.40

1.10

0.90

Notes:

1. Dimensions for all drawings are in millimeters.

2. Tolerance of ±0.15mm on all non-nominal dimensions

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

QRE1113, QRE1113GR — Minature Reflective Object Sensor

QRE1113 Package Dimensions

2.90

2.50

1.00

4

3

0.94

C

L

0.60

0.40

1.80

C

L

3.60

3.20

0.94

12

4.20

3.80

0.40

1.70

1.50

10.4

8.4

0~20°0~20°

Notes:

1. Dimensions for all drawings are in millimeters.

2. Tolerance of ±0.15mm on all non-nominal dimensions

Schematic

1234

Pin 1: Anode

Pin 2: Cathode

Pin 3: Collector

Pin 4: Emitter

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

2

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Absolute Maximum Ratings

(T

A

= 25°C unless otherwise specified)

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

The absolute maximum ratings are stress ratings only.

Symbol

T

OPR

T

STG

T

SOL-I

T

SOL-F

EMITTER

I

F

V

R

I

FP

P

D

SENSOR

V

CEO

V

ECO

I

C

P

D

Parameter

Operating Temperature

Storage Temperature

Soldering Temperature (Iron)

(2,3,4)

Soldering Temperature (Flow)

(2,3)

Continuous Forward Current

Reverse Voltage

Peak Forward Current

(5)

Power Dissipation

(1)

Collector-Emitter Voltage

Emitter-Collector Voltage

Collector Current

Power Dissipation

(1)

Rating

-40 to +85

-40 to +90

240 for 5 sec

260 for 10 sec

50

5

1

75

30

5

20

50

Units

°C

°C

°C

°C

mA

V

A

mW

V

V

mA

mW

Electrical/Optical Characteristics

(T

A

= 25°C unless otherwise specified)

Symbol

V

F

I

R

λ

PE

I

D

COUPLED

I

C(ON)

I

CX

V

CE (SAT)

t

r

t

f

On-State Collector Current

Cross-Talk Collector Current

Saturation Voltage

Rise Time

Fall Time

V

CC

= 5V, I

C(ON)

= 100µA,

R

L

= 1k

20

20

I

F

= 20mA, V

CE

= 5V

(6)

I

F

= 20mA, V

CE

= 5V

(7)

0.100.40

1

0.3

mA

µA

V

µs

Parameter

Forward Voltage

Reverse Leakage Current

Peak Emission Wavelength

Collector-Emitter Dark Current

Test Conditions

I

F

= 20mA

V

R

= 5V

I

F

= 20mA

I

F

= 0mA, V

CE

= 20V

.

1.2

940

Max.

1.6

10

Units

V

µA

nm

INPUT DIODE

OUTPUT TRANSISTOR

100nA

Notes:

power dissipation linearly 1.00mW/°C above 25°C.

flux is recommended.

ol or isopropyl alcohols are recommended as cleaning agents.

ing iron 1/16" (1.6mm) from housing.

conditions: tp = 100µs; T = 10ms.

6. Measured using an aluminum alloy mirror at d = 1mm.

7. No reflective surface at close proximity.

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

3

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Typical Performance Curves

I

C

(

O

N

)

-

N

O

R

M

A

L

I

Z

E

D

C

O

L

L

E

C

T

O

R

C

U

R

R

E

N

T

1.0

1.0

I

F

= 10 mA

V

CE

= 5 V

T

A

= 25˚C

0.8

I

C

(

O

N

)

-

C

O

L

L

E

C

T

O

R

C

U

R

R

E

N

T

(

m

A

)

0.8

d

0

0.6

0.6

0.4

Sensing Object:

White Paper (90% reflective)

0.2

Mirror

0.4

0.2

0.0

012345

0.0

d-DISTANCE (mm)

048121620

Fig. 1 Normalized Collector Current vs. Distance

between device and reflector

I

F

- FORWARD CURRENT (mA)

Fig. 2 Collector Current vs. Forward Current

I

C

(

O

N

)

-

N

O

R

M

A

L

I

Z

E

D

C

O

L

L

E

C

T

O

R

C

U

R

R

E

N

T

1.8

1.6

1.4

1.2

1.0

0.8

0.6

0.4

0.2

0.0

0.1

d = 1 mm, 90% reflection

T

A

= 25˚C

I

C

E

O

-

N

O

R

M

A

L

I

Z

E

D

D

A

R

K

C

U

R

R

E

N

T

2.0

10

2

Normalized to:

V

CE

= 10 V

T

A

= 25˚C

10

1

V

CE

= 10 V

V

CE

= 5 V

I

F

= 25mA

I

F

=20mA

I

F

=15mA

I

F

=10mA

I

F

=5mA

10

0

10

-1

110

10

-2

2540557085

V

CE

- COLLECTOR EMITTER VOLTAGE (V)

T

A

- Ambient Temperature (˚C)

Fig. 3 Normalized Collector Current vs.

Collector to Emitter Voltage

Fig. 4 Collector Emitter Dark Current (Normalized)

vs. Ambient Temperature

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

4

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Typical Performance Curves

(Continued)

50

100

T

A

= 25˚C

40

V

CC

= 10 V

t

pw

= 100 us

T=1ms

T

A

= 25˚C

t

f

10

t

r

I

C

= 0.3 mA

I

F

-

F

O

R

W

A

R

D

C

U

R

R

E

N

T

(

m

A

)

30

20

R

I

S

E

A

N

D

F

A

L

L

T

I

M

E

(

u

s

)

t

f

t

r

I

C

= 1 mA

10

0

1.01.11.21.31.41.5

1

0.1110

V

F

- FORWARD VOLTAGE (V)

R

L

- LOAD RESISTANCE (KΩ)

Fig. 6 Forward Current vs. Forward Voltage

Fig. 7 Rise and Fall Time vs. Load Resistance

3.0

V

F

-

F

O

R

W

A

R

D

V

O

L

T

A

G

E

(

V

)

R

E

L

A

T

I

V

E

R

A

D

I

A

N

T

I

N

T

E

N

S

I

T

Y

2.5

1.0

0.9

0.8

2.0

I

F

= 50 mA

I

F

= 20 mA

1.0

I

F

= 10 mA

1.5

0.5

0.7

0.0

-40-2

0.60.40.200.20.40.6

T

A

- AMBIENT TEMPERATURE (˚C)

ANGULAR DISPLACEMENT

Fig. 8

Forward Voltage vs. Ambient Temperature

Fig. 8 Radiation Diagram

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

5

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Recommended Solder Screen Pattern for GR option (for reference only)

1.1

LED (+)

1.0

0.8

2.8

Dimensions in mm

Taping Dimensions for GR option

Progressive Direction

2.0±0.054.0

ø1.5

0.25

1.75

5.5±0.05

12.0±0.3

4.75

3.73

8.0

1.98

General tolerance ±0.1

Dimensions in mm

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

6

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Reflow Profile

260°C max. for 10 sec. max.

1°C to 5°C/sec

260°C

T

e

m

p

e

r

a

t

u

r

e

(

°

C

)

Pre-heating

180°C to 200°C

1°C to 5°C/sec

220°C

60 sec. max.

above 220°C

120 sec. max.

Time (seconds)

Note: Reflow soldering should not be done more than twice.

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

7

QRE1113, QRE1113GR — Minature Reflective Object Sensor

TRADEMARKS

Thefollowingincludesregisteredandunregisteredtrademarksandservicemarks,ownedbyFairchildSemiconductorand/oritsglobalsubsidiaries,andisnot

intendedtobeanexhaustivelistofallsuchtrademarks.

Auto-SPM™

BuilditNow™

CorePLUS™

CorePOWER™

CROSSVOLT™

CTL™

CurrentTransferLogic™

EcoSPARK

®

EfficentMax™

EZSWITCH™*

™*

®

Fairchild

®

FairchildSemiconductor

FACTQuietSeries™

FACT

®

FAST

®

FastvCore™

FETBench™

FlashWriter

®

*

FPS™

®

F-PFS™

FRFET

®

SM

GlobalPowerResource

GreenFPS™

GreenFPS™e-Series™

Gmax™

GTO™

IntelliMAX™

ISOPLANAR™

MegaBuck™

MICROCOUPLER™

MicroFET™

MicroPak™

MillerDrive™

MotionMax™

Motion-SPM™

OPTOLOGIC

®

OPTOPLANAR

®

®

PowerTrench

®

PowerXS™

ProgrammableActiveDroop™

QFET

®

QS™

QuietSeries™

RapidConfigure™

Savingourworld,1mW/W/kWatatime™

SmartMax™

SMARTSTART™

SPM

®

STEALTH™

SuperFET™

SuperSOT™-3

SuperSOT™-6

SuperSOT™-8

SupreMOS™

SyncFET™

Sync-Lock™

®

*

ThePowerFranchise

®

TinyBoost™

TinyBuck™

TinyLogic

®

TINYOPTO™

TinyPower™

TinyPWM™

TinyWire™

TriFaultDetect™

TRUECURRENT™*

µSerDes™

UHC

®

UltraFRFET™

UniFET™

VCX™

VisualMax™

XS™

PDPSPM™

Power-SPM™

*TrademarksofSystemGeneralCorporation,usedunderlicensebyFairchildSemiconductor.

DISCLAIMER

FAIRCHILDSEMICONDUCTORRESERVESTHERIGHTTOMAKECHANGESWITHOUTFURTHERNOTICETOANYPRODUCTSHEREINTOIMPROVE

RELIABILITY,FUNCTION,ILDDOESNOTASSUMEANYLIABILITYARISINGOUTOFTHEAPPLICATIONORUSEOFANYPRODUCTOR

CIRCUITDESCRIBEDHEREIN;NEITHERDOESITCONVEYANYLICENSEUNDERITSPATENTRIGHTS,

SPECIFICATIONSDONOTEXPANDTHETERMSOFFAIRCHILD’SWORLDWIDETERMSANDCONDITIONS,SPECIFICALLYTHEWARRANTYTHEREIN,

WHICHCOVERSTHESEPRODUCTS.

LIFESUPPORTPOLICY

FAIRCHILD’SPRODUCTSARENOTAUTHORIZEDFORUSEASCRITICALCOMPONENTSINLIFESUPPORTDEVICESORSYSTEMSWITHOUTTHE

EXPRESSWRITTENAPPROVALOFFAIRCHILDSEMICONDUCTORCORPORATION.

Asusedherein:

pportdevicesorsystemsaredevicesorsystemswhich,(a)are

intendedforsurgicalimplantintothebodyor(b)supportorsustainlife,

and(c)whosefailuretoperformwhenproperlyusedinaccordance

withinstructionsforuseprovidedinthelabeling,canbereasonably

expectedtoresultinasignificantinjuryoftheuser.

calcomponentinanycomponentofalifesupport,device,or

systemwhosefailuretoperformcanbereasonablyexpectedto

causethefailureofthelifesupportdeviceorsystem,ortoaffectits

safetyoreffectiveness.

ANTI-COUNTERFEITINGPOLICY

FairchildSemiconductorCorporation'ild'sAnti-CounterfeitingPolicyisalsostatedonourexternalwebsite,,

underSalesSupport.

Cufacturersofsemiconductorproductsareexperiencingcounterfeitingoftheirparts.

Customerswhoinadvertentlypurchasecounterfeitpartsexperiencemanyproblemssuchaslossofbrandreputation,substandardperformance,failedapplications,

ildistakingstrongmeasurestoprotectourselvesandourcustomersfromtheproliferationof

ildstronglyencouragescustomerstopurchaseFairchildpartseitherdirectlyfromFairchildorfromAuthorizedFairchildDistributorswhoare

tscustomersbuyeitherfromFairchilddirectlyorfromAuthorizedFairchildDistributorsaregenuineparts,have

fulltraceability,meetFairchild'squalitystandardsforhandlingandstorageandprovideaccesstoFairchild'sfullrangeofup-to-datetechnicalandproductinformation.

FairchildandourAuthorizedDistributorswillstandbehindallwarildwillnotprovide

anywarrantildiscommittedtocombatthisglobalproblemandencourageour

customerstodotheirpartinstoppingthispracticebybuyingdirectorfromauthorizeddistributors.

PRODUCTSTATUSDEFINITIONS

DefinitionofTerms

DatasheetIdentification

AdvanceInformation

Preliminary

NoIdentificationNeeded

Obsolete

ProductStatus

Formative/InDesign

FirstProduction

FullProduction

NotInProduction

Definition

icationsmaychangein

anymannerwithoutnotice.

Datasheetcontainspreliminarydata;ild

Semiconductorreservestherighttomakechangesatanytimewithoutnoticetoimprovedesign.

ildSemiconductorreservestherighttomakechanges

atanytimewithoutnoticetoimprovethedesign.

DatasheetcontainsspecificationsonaproductthatisdiscontinuedbyFairchildSemiconductor.

Thedatasheetisforreferenceinformationonly.

Rev.I40

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

8

2024年7月31日发(作者:经禹)

QRE1113, QRE1113GR — Minature Reflective Object Sensor

September 2009

QRE1113, QRE1113GR

Minature Reflective Object Sensor

Features

Phototransistor output

No contact surface sensing

Miniature package

Lead form style: Gull Wing

Two leadform options:Through hole (QRE1113)

SMT gullwing (QRE1113GR)

Two packaging options:Tube (QRE1113)

Tape and reel (QRE1113GR)

QRE1113GR Package Dimensions

2.90

2.50

1.00

4

3

0.94

C

L

0.60

0.40

1.80

C

L

3.60

3.20

0.94

12

30°

0.40

1.70

1.50

0.61 Nom.

(4x)

4.80

4.40

1.10

0.90

Notes:

1. Dimensions for all drawings are in millimeters.

2. Tolerance of ±0.15mm on all non-nominal dimensions

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

QRE1113, QRE1113GR — Minature Reflective Object Sensor

QRE1113 Package Dimensions

2.90

2.50

1.00

4

3

0.94

C

L

0.60

0.40

1.80

C

L

3.60

3.20

0.94

12

4.20

3.80

0.40

1.70

1.50

10.4

8.4

0~20°0~20°

Notes:

1. Dimensions for all drawings are in millimeters.

2. Tolerance of ±0.15mm on all non-nominal dimensions

Schematic

1234

Pin 1: Anode

Pin 2: Cathode

Pin 3: Collector

Pin 4: Emitter

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

2

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Absolute Maximum Ratings

(T

A

= 25°C unless otherwise specified)

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

The absolute maximum ratings are stress ratings only.

Symbol

T

OPR

T

STG

T

SOL-I

T

SOL-F

EMITTER

I

F

V

R

I

FP

P

D

SENSOR

V

CEO

V

ECO

I

C

P

D

Parameter

Operating Temperature

Storage Temperature

Soldering Temperature (Iron)

(2,3,4)

Soldering Temperature (Flow)

(2,3)

Continuous Forward Current

Reverse Voltage

Peak Forward Current

(5)

Power Dissipation

(1)

Collector-Emitter Voltage

Emitter-Collector Voltage

Collector Current

Power Dissipation

(1)

Rating

-40 to +85

-40 to +90

240 for 5 sec

260 for 10 sec

50

5

1

75

30

5

20

50

Units

°C

°C

°C

°C

mA

V

A

mW

V

V

mA

mW

Electrical/Optical Characteristics

(T

A

= 25°C unless otherwise specified)

Symbol

V

F

I

R

λ

PE

I

D

COUPLED

I

C(ON)

I

CX

V

CE (SAT)

t

r

t

f

On-State Collector Current

Cross-Talk Collector Current

Saturation Voltage

Rise Time

Fall Time

V

CC

= 5V, I

C(ON)

= 100µA,

R

L

= 1k

20

20

I

F

= 20mA, V

CE

= 5V

(6)

I

F

= 20mA, V

CE

= 5V

(7)

0.100.40

1

0.3

mA

µA

V

µs

Parameter

Forward Voltage

Reverse Leakage Current

Peak Emission Wavelength

Collector-Emitter Dark Current

Test Conditions

I

F

= 20mA

V

R

= 5V

I

F

= 20mA

I

F

= 0mA, V

CE

= 20V

.

1.2

940

Max.

1.6

10

Units

V

µA

nm

INPUT DIODE

OUTPUT TRANSISTOR

100nA

Notes:

power dissipation linearly 1.00mW/°C above 25°C.

flux is recommended.

ol or isopropyl alcohols are recommended as cleaning agents.

ing iron 1/16" (1.6mm) from housing.

conditions: tp = 100µs; T = 10ms.

6. Measured using an aluminum alloy mirror at d = 1mm.

7. No reflective surface at close proximity.

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

3

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Typical Performance Curves

I

C

(

O

N

)

-

N

O

R

M

A

L

I

Z

E

D

C

O

L

L

E

C

T

O

R

C

U

R

R

E

N

T

1.0

1.0

I

F

= 10 mA

V

CE

= 5 V

T

A

= 25˚C

0.8

I

C

(

O

N

)

-

C

O

L

L

E

C

T

O

R

C

U

R

R

E

N

T

(

m

A

)

0.8

d

0

0.6

0.6

0.4

Sensing Object:

White Paper (90% reflective)

0.2

Mirror

0.4

0.2

0.0

012345

0.0

d-DISTANCE (mm)

048121620

Fig. 1 Normalized Collector Current vs. Distance

between device and reflector

I

F

- FORWARD CURRENT (mA)

Fig. 2 Collector Current vs. Forward Current

I

C

(

O

N

)

-

N

O

R

M

A

L

I

Z

E

D

C

O

L

L

E

C

T

O

R

C

U

R

R

E

N

T

1.8

1.6

1.4

1.2

1.0

0.8

0.6

0.4

0.2

0.0

0.1

d = 1 mm, 90% reflection

T

A

= 25˚C

I

C

E

O

-

N

O

R

M

A

L

I

Z

E

D

D

A

R

K

C

U

R

R

E

N

T

2.0

10

2

Normalized to:

V

CE

= 10 V

T

A

= 25˚C

10

1

V

CE

= 10 V

V

CE

= 5 V

I

F

= 25mA

I

F

=20mA

I

F

=15mA

I

F

=10mA

I

F

=5mA

10

0

10

-1

110

10

-2

2540557085

V

CE

- COLLECTOR EMITTER VOLTAGE (V)

T

A

- Ambient Temperature (˚C)

Fig. 3 Normalized Collector Current vs.

Collector to Emitter Voltage

Fig. 4 Collector Emitter Dark Current (Normalized)

vs. Ambient Temperature

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

4

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Typical Performance Curves

(Continued)

50

100

T

A

= 25˚C

40

V

CC

= 10 V

t

pw

= 100 us

T=1ms

T

A

= 25˚C

t

f

10

t

r

I

C

= 0.3 mA

I

F

-

F

O

R

W

A

R

D

C

U

R

R

E

N

T

(

m

A

)

30

20

R

I

S

E

A

N

D

F

A

L

L

T

I

M

E

(

u

s

)

t

f

t

r

I

C

= 1 mA

10

0

1.01.11.21.31.41.5

1

0.1110

V

F

- FORWARD VOLTAGE (V)

R

L

- LOAD RESISTANCE (KΩ)

Fig. 6 Forward Current vs. Forward Voltage

Fig. 7 Rise and Fall Time vs. Load Resistance

3.0

V

F

-

F

O

R

W

A

R

D

V

O

L

T

A

G

E

(

V

)

R

E

L

A

T

I

V

E

R

A

D

I

A

N

T

I

N

T

E

N

S

I

T

Y

2.5

1.0

0.9

0.8

2.0

I

F

= 50 mA

I

F

= 20 mA

1.0

I

F

= 10 mA

1.5

0.5

0.7

0.0

-40-2

0.60.40.200.20.40.6

T

A

- AMBIENT TEMPERATURE (˚C)

ANGULAR DISPLACEMENT

Fig. 8

Forward Voltage vs. Ambient Temperature

Fig. 8 Radiation Diagram

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

5

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Recommended Solder Screen Pattern for GR option (for reference only)

1.1

LED (+)

1.0

0.8

2.8

Dimensions in mm

Taping Dimensions for GR option

Progressive Direction

2.0±0.054.0

ø1.5

0.25

1.75

5.5±0.05

12.0±0.3

4.75

3.73

8.0

1.98

General tolerance ±0.1

Dimensions in mm

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

6

QRE1113, QRE1113GR — Minature Reflective Object Sensor

Reflow Profile

260°C max. for 10 sec. max.

1°C to 5°C/sec

260°C

T

e

m

p

e

r

a

t

u

r

e

(

°

C

)

Pre-heating

180°C to 200°C

1°C to 5°C/sec

220°C

60 sec. max.

above 220°C

120 sec. max.

Time (seconds)

Note: Reflow soldering should not be done more than twice.

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

7

QRE1113, QRE1113GR — Minature Reflective Object Sensor

TRADEMARKS

Thefollowingincludesregisteredandunregisteredtrademarksandservicemarks,ownedbyFairchildSemiconductorand/oritsglobalsubsidiaries,andisnot

intendedtobeanexhaustivelistofallsuchtrademarks.

Auto-SPM™

BuilditNow™

CorePLUS™

CorePOWER™

CROSSVOLT™

CTL™

CurrentTransferLogic™

EcoSPARK

®

EfficentMax™

EZSWITCH™*

™*

®

Fairchild

®

FairchildSemiconductor

FACTQuietSeries™

FACT

®

FAST

®

FastvCore™

FETBench™

FlashWriter

®

*

FPS™

®

F-PFS™

FRFET

®

SM

GlobalPowerResource

GreenFPS™

GreenFPS™e-Series™

Gmax™

GTO™

IntelliMAX™

ISOPLANAR™

MegaBuck™

MICROCOUPLER™

MicroFET™

MicroPak™

MillerDrive™

MotionMax™

Motion-SPM™

OPTOLOGIC

®

OPTOPLANAR

®

®

PowerTrench

®

PowerXS™

ProgrammableActiveDroop™

QFET

®

QS™

QuietSeries™

RapidConfigure™

Savingourworld,1mW/W/kWatatime™

SmartMax™

SMARTSTART™

SPM

®

STEALTH™

SuperFET™

SuperSOT™-3

SuperSOT™-6

SuperSOT™-8

SupreMOS™

SyncFET™

Sync-Lock™

®

*

ThePowerFranchise

®

TinyBoost™

TinyBuck™

TinyLogic

®

TINYOPTO™

TinyPower™

TinyPWM™

TinyWire™

TriFaultDetect™

TRUECURRENT™*

µSerDes™

UHC

®

UltraFRFET™

UniFET™

VCX™

VisualMax™

XS™

PDPSPM™

Power-SPM™

*TrademarksofSystemGeneralCorporation,usedunderlicensebyFairchildSemiconductor.

DISCLAIMER

FAIRCHILDSEMICONDUCTORRESERVESTHERIGHTTOMAKECHANGESWITHOUTFURTHERNOTICETOANYPRODUCTSHEREINTOIMPROVE

RELIABILITY,FUNCTION,ILDDOESNOTASSUMEANYLIABILITYARISINGOUTOFTHEAPPLICATIONORUSEOFANYPRODUCTOR

CIRCUITDESCRIBEDHEREIN;NEITHERDOESITCONVEYANYLICENSEUNDERITSPATENTRIGHTS,

SPECIFICATIONSDONOTEXPANDTHETERMSOFFAIRCHILD’SWORLDWIDETERMSANDCONDITIONS,SPECIFICALLYTHEWARRANTYTHEREIN,

WHICHCOVERSTHESEPRODUCTS.

LIFESUPPORTPOLICY

FAIRCHILD’SPRODUCTSARENOTAUTHORIZEDFORUSEASCRITICALCOMPONENTSINLIFESUPPORTDEVICESORSYSTEMSWITHOUTTHE

EXPRESSWRITTENAPPROVALOFFAIRCHILDSEMICONDUCTORCORPORATION.

Asusedherein:

pportdevicesorsystemsaredevicesorsystemswhich,(a)are

intendedforsurgicalimplantintothebodyor(b)supportorsustainlife,

and(c)whosefailuretoperformwhenproperlyusedinaccordance

withinstructionsforuseprovidedinthelabeling,canbereasonably

expectedtoresultinasignificantinjuryoftheuser.

calcomponentinanycomponentofalifesupport,device,or

systemwhosefailuretoperformcanbereasonablyexpectedto

causethefailureofthelifesupportdeviceorsystem,ortoaffectits

safetyoreffectiveness.

ANTI-COUNTERFEITINGPOLICY

FairchildSemiconductorCorporation'ild'sAnti-CounterfeitingPolicyisalsostatedonourexternalwebsite,,

underSalesSupport.

Cufacturersofsemiconductorproductsareexperiencingcounterfeitingoftheirparts.

Customerswhoinadvertentlypurchasecounterfeitpartsexperiencemanyproblemssuchaslossofbrandreputation,substandardperformance,failedapplications,

ildistakingstrongmeasurestoprotectourselvesandourcustomersfromtheproliferationof

ildstronglyencouragescustomerstopurchaseFairchildpartseitherdirectlyfromFairchildorfromAuthorizedFairchildDistributorswhoare

tscustomersbuyeitherfromFairchilddirectlyorfromAuthorizedFairchildDistributorsaregenuineparts,have

fulltraceability,meetFairchild'squalitystandardsforhandlingandstorageandprovideaccesstoFairchild'sfullrangeofup-to-datetechnicalandproductinformation.

FairchildandourAuthorizedDistributorswillstandbehindallwarildwillnotprovide

anywarrantildiscommittedtocombatthisglobalproblemandencourageour

customerstodotheirpartinstoppingthispracticebybuyingdirectorfromauthorizeddistributors.

PRODUCTSTATUSDEFINITIONS

DefinitionofTerms

DatasheetIdentification

AdvanceInformation

Preliminary

NoIdentificationNeeded

Obsolete

ProductStatus

Formative/InDesign

FirstProduction

FullProduction

NotInProduction

Definition

icationsmaychangein

anymannerwithoutnotice.

Datasheetcontainspreliminarydata;ild

Semiconductorreservestherighttomakechangesatanytimewithoutnoticetoimprovedesign.

ildSemiconductorreservestherighttomakechanges

atanytimewithoutnoticetoimprovethedesign.

DatasheetcontainsspecificationsonaproductthatisdiscontinuedbyFairchildSemiconductor.

Thedatasheetisforreferenceinformationonly.

Rev.I40

©2002 Fairchild Semiconductor Corporation

QRE1113, QRE1113GR Rev. 1.6.0

8

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