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赛默飞世尔 Apreo 2 扫描电子显微镜 技术规格书说明书

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2024年4月12日发(作者:邢宛白)

Datasheet

Apreo 2 SEM

Unmatched versatility powered by ChemiSEM Technology

Resolve gray areas with the Thermo

Scientific Apreo 2 SEM, a high-

performance field emission gun (FEG) SEM

with unique, live elemental imaging and an

advanced, automated optics system that

enables you to focus on your research

rather than microscope performance.

The Thermo Scientific

Apreo

SEM has earned a reputation

for its versatility and high-quality imaging performance—

even on magnetic or other traditionally difficult samples. The

Apreo 2 SEM improves its impressive resolution specifications

and introduces live quantitative elemental mapping. A number

of other new features are designed to make its advanced

capabilities accessible for all users.

Multi-purpose labs see a wide spectrum of users looking to

image a wide range of sample types. Typically, this would

mean that users are required to navigate a range of alignments

before acquiring data. The Apreo 2 SEM introduces Smart

Align Technology to optimize image acquisition settings and

remove the need for user alignments. With the broad base of

alignment automation covered, you can focus on obtaining

data, as the system is always aligned and ready to image.

Thanks to Smart Align Technology and automated fine tuning

processes (FLASH), new users can easily access the high-end

performance of the Apreo 2 SEM.

The Apreo 2 SEM’s feature set also expands to analytical

capability by integrating Thermo Scientific

ChemiSEM

Technology into the main microscope UI. ChemiSEM

Technology revolutionizes and simplifies EDS analysis by fully

integrating SEM and EDS functions into a single, cohesive

user interface. Based on live quantification and building on

decades of expertise in EDS analysis, the technology provides

elemental information quickly and easily, guaranteeing reliable

results. And because ChemiSEM Technology is always on,

it can dramatically shorten time to results, highlight features

that would have previously gone unnoticed, and provide more

complete information.

P2P3P4

ChemiPhase image showing different phases present in a complex

inclusion in steel.

AgCuOSiCa

Microstructure of copper-silver alloy revealed with ChemiSEM technology.

Silicate contamination is immediately recognized when inspecting

samples with live compositional imaging via ChemiSEM.

Key features

All-round nanometer or sub-nanometer resolution

performance on materials ranging from nanoparticles,

powders, catalysts, and nanodevices to bulk magnetic

samples, even at long (10 mm) working distances

Extreme flexibility for handling a wide range of sample

types, including insulators, sensitive materials, or magnetic

samples, and for collecting the data that matters most to

your application

Less time spent on maintenance with an optics system that

aligns itself (SmartAlign Technology)

Elemental information at your fingertips with ChemiSEM

Technology; live quantitative elemental mapping for

unprecedented time to result and ease of use

Advanced automation including FLASH Technology for

automatic image fine tuning, undo, user guidance, maps

tiling, and stitching

5 µm

2 µm

The result is an easy-to-use system that allows you to focus on

discovery rather than manipulating multiple software packages.

The Apreo SEM’s unique Trinity in-column detection system

is present, but now with improved performance. The

Apreo 2 SEM remains the platform of choice for research on

nanoparticles, catalysts, powders, and nanodevices, thanks

to its innovative final lens design that does not compromise on

magnetic sample imaging performance. The electrostatic final

lens (available on Apreo 2 C and Apreo 2 S SEMs) enables

simultaneous in-column detection at high resolution, while

the Apreo 2 S SEM combines the electrostatic final lens with

magnetic immersion into a compound lens. The compound

final lens further boosts resolution performance, providing

a resolution of 0.9 nm at 1 kV without additional beam

deceleration, while offering unique options for signal filtering.

For the most challenging applications, the Apreo 2 SEM’s

charge mitigation routines can include optional low vacuum (up

to 500 Pa) to mitigate charge on any sample while providing

excellent resolution and large analytical currents with field-

proven through-the-lens differential pumping and dedicated

LoVac detectors.

All these capabilities are complemented by easy sample

handling and an easy-to-use microscope user interface,

saving time for novice and expert users alike. A customizable

user interface provides many options for user guidance,

automation, and remote operation. With unique technologies

like SmartAlign, FLASH, and ChemiSEM Technology added

to an already advanced microscope, the Apreo 2 SEM adds

additional flexibility to any lab while providing advanced imaging

capability for all users.

Electron optics

High-resolution field emission SEM column with:

High-stability Schottky field emission gun to provide

stable high-resolution analytical currents

Compound final lens: a combined electrostatic, field-

free magnetic and immersion magnetic objective lens

(optional)

60° objective lens geometry: allows tilting larger samples

Automated heated apertures to ensure cleanliness and

touch-free aperture changes

SmartAlign Technology: user-alignment-free technology

Through-the-lens differential pumping for low vacuum

(optional) reduces beam skirting for the most accurate

analysis and highest resolution

Beam deceleration with stage bias from -4,000 V to +600 V

Continuous beam current control and optimized

aperture angle

Double stage scanning deflection

Easy gun installation and

maintenance: auto bake-out, auto

start, no mechanical alignments

PivotBeam Mode for selected area

electron channeling, also known as

“rocking beam” mode (Apreo 2 S

model only)

Guaranteed minimum source lifetime: 24 months

Apreo 2 CApreo 2 S

Final lensElectrostaticCompound

High vacuum

30 kV (STEM) 0.7 nm0.7 nm

15 kV (BD)0.9 nm0.5 nm

15 kV (6.4 nA, WD 10 mm) 1.9 nm

1 kV1.2 nm0.9 nm

1 kV (BD) 1.0 nm0.8 nm

1 kV (BD, WD 10 mm) 1.0 nm

500 V (BD) 1.2 nm0.8 nm

200 V (BD) 1.2 nm

High vacuum (optional)

3 kV (30 Pa) 1.8 nm1.8 nm

15 kV (30 Pa) 1.2 nm1.2 nm

BD: beam deceleration mode. WD: working distance. Resolutions are at optimum working

distance unless specified otherwise. By default, upon final installation,the resolution is proven in

the systems acceptance test at 1 kV and 30 kV in highvacuum and with immersion switched on

if applicable.

Electron beam resolution

Electron beam parameter space

Beam current range: 1 pA to 50 nA

(400 nA configuration also available)

Accelerating voltage range: 200 V – 30 kV

Landing energy range: 20 eV – 30 keV

Max. horizontal field width: 3 mm at 10 mm WD

(corresponds to 29x minimum magnification)

Chamber

Inner width: 340 mm

Analytical working distance: 10 mm

Ports: 12

EDS take-off angle: 35°

Three simultaneous EDS detectors possible, two at 180°

Coplanar EDS/EBSD orthogonal to the tilt axis of the stage

Detectors

The Apreo 2 SEM detects up to four signals simultaneously

from any combination of the available detectors or detector

segments (optional):

Trinity Detection System (in-lens and in-column)

T1 segmented lower in-lens detector

T2 upper in-lens detector

T3 in-column detector (optional)

ETD—Everhart-Thornley SE detector

DBS—Retractable segmented under-the-lens BSED

(optional)

Low-vacuum SE detector (optional)

DBS-GAD—Lens-mounted gaseous analytical BSED

(optional)

STEM 3+—Retractable segmented detector

(BF, DF, HADF, HAADF) (optional)

IR-CCD

Thermo Scientific Nav-Cam

Camera (chamber-mounted)

ChemiSEM Technology (optional)

EDS detector size: 10, 30, or 60 mm²

Light element sensitivity down to beryllium

127 eV or 129 eV spectral resolution

Optional motorized slide available

Vacuum system

Complete oil-free vacuum system

1 × 240 l/s TMP

1 × PVP-scroll

2 × IGP

Chamber vacuum (high vacuum) <6.3 × 10-6 mbar

(after 12 hours pumping)

Evacuation time: ≤3.5 minute

Optional low-vacuum mode

10–500 Pa chamber pressure

Automatic Pressure Limiting Aperture (PLA) Loader

Sample holders

Standard multi-purpose holder uniquely mounts directly

onto the stage, hosts up to 18 standard stubs (ø12 mm),

three pre-tilted stubs, cross-section samples, and two pre-

tilted row-bar holders (optional) (38° and 90°). Tools are not

required to mount a sample.

Each optional row-bar accommodates 6 STEM grids

Wafer and custom holders (optional)

TypeEucentric goniometer stage,

5 axes motorized

XY110x110 mm

Repeatability <3.0 μm (@ 0° tilt)

Motorized Z65 mm

Rotationn × 360°

Tilt -15° / +90°

Max. sample heightClearance 85 mm to eucentric point

Max. sample weight 500 g in any stage position

Up to 5 kg at 0° tilt

Max. sample size122 mm diameter with full

X, Y, rotation (larger samples

possible with limited stage

travel or rotation)

System control

64-bit GUI with Windows 10, keyboard, optical mouse

24-inch LCD display, WUXGA 1920×1200

(second monitor optional)

Customizable graphical user interface,

with up to 4 simultaneously active views

FLASH automated image tuning for focus,

lens align, and stigmator

Image registration

Navigation montage

Image analysis software

Undo / Redo functionality

User guidance for basic operations / applications

Optional joystick

Optional manual user interface (knob board)

Image processor

Dwell time range from 25 ns to 25 ms/pixel

Up to 6144×4096 pixels

File type: TIFF (8-, 16-, 24-bit), JPEG or BMP

Single-frame or 4-view image display

SmartScan Mode (256-frame average or integration, line

integration and averaging, interlaced scanning)

DCFI (drift compensated frame integration) Mode

Digital image improvement and noise reduction filter

Accessories (optional)

Sample / chamber cleaning: CryoCleaner,

Warranty and Training

1 year warranty

Choice of service maintenance contracts

Choice of operation / application training contracts

Integrated Plasma Cleaner

Analysis: EDS, EBSD, WDS, CL, Raman

Thermo Scientific QuickLoader Load Lock for fast

sample transfer

Navigation: correlative navigation, Thermo Scientific Maps

Installation requirement

(Refer to preinstall guide for detailed data)

Power:

Voltage 100–240 V AC (-6%, +10%)

Frequency 50 or 60 Hz (±1%)

Consumption: <3.0 kVA for basic microscope

Earth resistance <0.1 Ω

Environment:

Temperature (20 ± 3)°C

Relative humidity below 80%

Stray AC magnetic fields <40 nT asynchronous, <100

Software tiling and stitching

Gas injection: up to 2 units (other accessories may limit

number of GIS available) for beam-induced deposition of:

Platinum

Tungsten

Carbon

Manipulators

Cryo-stage

Electrical probing / multi-probing stations

Electrostatic beam blanker

CleanConnect Sample Transfer Device

nT synchronous for line times, 20 ms (50 Hz mains) or

17 ms (60 Hz mains)

Minimum door size: 0.9 m wide × 1.9 m high

Weight: column console 980 kg

Dry nitrogen recommended for venting

Compressed air 4–6 bar, clean, dry and oil-free

System chiller

Acoustics: site survey required,

Software options

Maps Software for automatic large area acquisition using

tiling and stitching; correlative work

Thermo Scientific AutoScript

4 Software—Python-based

application programming interface

TopoMaps for image colorization, image analysis,

and 3D surface reconstruction

Advanced image analysis software

Remote control software

as acoustic spectrum relevant

Floor vibrations: site survey required,

as floor spectrum relevant

Optional active vibration isolation table

Documentation

Online user guidance

Operating instructions handbook

Online help

Prepared for RAPID (remote diagnostic support)

Free access to online resources for owners

Consumables (partial list)

Replacement Schottky electron source module

L earn more at /apreo

For research use only. Not for use in diagnostic procedures. For current certifications, visit /certifications

© 2023 Thermo Fisher Scientific Inc. All rights reserved. All trademarks are the property of Thermo Fisher Scientific

and its subsidiaries unless otherwise specified. DS0345-EN-07-2023

2024年4月12日发(作者:邢宛白)

Datasheet

Apreo 2 SEM

Unmatched versatility powered by ChemiSEM Technology

Resolve gray areas with the Thermo

Scientific Apreo 2 SEM, a high-

performance field emission gun (FEG) SEM

with unique, live elemental imaging and an

advanced, automated optics system that

enables you to focus on your research

rather than microscope performance.

The Thermo Scientific

Apreo

SEM has earned a reputation

for its versatility and high-quality imaging performance—

even on magnetic or other traditionally difficult samples. The

Apreo 2 SEM improves its impressive resolution specifications

and introduces live quantitative elemental mapping. A number

of other new features are designed to make its advanced

capabilities accessible for all users.

Multi-purpose labs see a wide spectrum of users looking to

image a wide range of sample types. Typically, this would

mean that users are required to navigate a range of alignments

before acquiring data. The Apreo 2 SEM introduces Smart

Align Technology to optimize image acquisition settings and

remove the need for user alignments. With the broad base of

alignment automation covered, you can focus on obtaining

data, as the system is always aligned and ready to image.

Thanks to Smart Align Technology and automated fine tuning

processes (FLASH), new users can easily access the high-end

performance of the Apreo 2 SEM.

The Apreo 2 SEM’s feature set also expands to analytical

capability by integrating Thermo Scientific

ChemiSEM

Technology into the main microscope UI. ChemiSEM

Technology revolutionizes and simplifies EDS analysis by fully

integrating SEM and EDS functions into a single, cohesive

user interface. Based on live quantification and building on

decades of expertise in EDS analysis, the technology provides

elemental information quickly and easily, guaranteeing reliable

results. And because ChemiSEM Technology is always on,

it can dramatically shorten time to results, highlight features

that would have previously gone unnoticed, and provide more

complete information.

P2P3P4

ChemiPhase image showing different phases present in a complex

inclusion in steel.

AgCuOSiCa

Microstructure of copper-silver alloy revealed with ChemiSEM technology.

Silicate contamination is immediately recognized when inspecting

samples with live compositional imaging via ChemiSEM.

Key features

All-round nanometer or sub-nanometer resolution

performance on materials ranging from nanoparticles,

powders, catalysts, and nanodevices to bulk magnetic

samples, even at long (10 mm) working distances

Extreme flexibility for handling a wide range of sample

types, including insulators, sensitive materials, or magnetic

samples, and for collecting the data that matters most to

your application

Less time spent on maintenance with an optics system that

aligns itself (SmartAlign Technology)

Elemental information at your fingertips with ChemiSEM

Technology; live quantitative elemental mapping for

unprecedented time to result and ease of use

Advanced automation including FLASH Technology for

automatic image fine tuning, undo, user guidance, maps

tiling, and stitching

5 µm

2 µm

The result is an easy-to-use system that allows you to focus on

discovery rather than manipulating multiple software packages.

The Apreo SEM’s unique Trinity in-column detection system

is present, but now with improved performance. The

Apreo 2 SEM remains the platform of choice for research on

nanoparticles, catalysts, powders, and nanodevices, thanks

to its innovative final lens design that does not compromise on

magnetic sample imaging performance. The electrostatic final

lens (available on Apreo 2 C and Apreo 2 S SEMs) enables

simultaneous in-column detection at high resolution, while

the Apreo 2 S SEM combines the electrostatic final lens with

magnetic immersion into a compound lens. The compound

final lens further boosts resolution performance, providing

a resolution of 0.9 nm at 1 kV without additional beam

deceleration, while offering unique options for signal filtering.

For the most challenging applications, the Apreo 2 SEM’s

charge mitigation routines can include optional low vacuum (up

to 500 Pa) to mitigate charge on any sample while providing

excellent resolution and large analytical currents with field-

proven through-the-lens differential pumping and dedicated

LoVac detectors.

All these capabilities are complemented by easy sample

handling and an easy-to-use microscope user interface,

saving time for novice and expert users alike. A customizable

user interface provides many options for user guidance,

automation, and remote operation. With unique technologies

like SmartAlign, FLASH, and ChemiSEM Technology added

to an already advanced microscope, the Apreo 2 SEM adds

additional flexibility to any lab while providing advanced imaging

capability for all users.

Electron optics

High-resolution field emission SEM column with:

High-stability Schottky field emission gun to provide

stable high-resolution analytical currents

Compound final lens: a combined electrostatic, field-

free magnetic and immersion magnetic objective lens

(optional)

60° objective lens geometry: allows tilting larger samples

Automated heated apertures to ensure cleanliness and

touch-free aperture changes

SmartAlign Technology: user-alignment-free technology

Through-the-lens differential pumping for low vacuum

(optional) reduces beam skirting for the most accurate

analysis and highest resolution

Beam deceleration with stage bias from -4,000 V to +600 V

Continuous beam current control and optimized

aperture angle

Double stage scanning deflection

Easy gun installation and

maintenance: auto bake-out, auto

start, no mechanical alignments

PivotBeam Mode for selected area

electron channeling, also known as

“rocking beam” mode (Apreo 2 S

model only)

Guaranteed minimum source lifetime: 24 months

Apreo 2 CApreo 2 S

Final lensElectrostaticCompound

High vacuum

30 kV (STEM) 0.7 nm0.7 nm

15 kV (BD)0.9 nm0.5 nm

15 kV (6.4 nA, WD 10 mm) 1.9 nm

1 kV1.2 nm0.9 nm

1 kV (BD) 1.0 nm0.8 nm

1 kV (BD, WD 10 mm) 1.0 nm

500 V (BD) 1.2 nm0.8 nm

200 V (BD) 1.2 nm

High vacuum (optional)

3 kV (30 Pa) 1.8 nm1.8 nm

15 kV (30 Pa) 1.2 nm1.2 nm

BD: beam deceleration mode. WD: working distance. Resolutions are at optimum working

distance unless specified otherwise. By default, upon final installation,the resolution is proven in

the systems acceptance test at 1 kV and 30 kV in highvacuum and with immersion switched on

if applicable.

Electron beam resolution

Electron beam parameter space

Beam current range: 1 pA to 50 nA

(400 nA configuration also available)

Accelerating voltage range: 200 V – 30 kV

Landing energy range: 20 eV – 30 keV

Max. horizontal field width: 3 mm at 10 mm WD

(corresponds to 29x minimum magnification)

Chamber

Inner width: 340 mm

Analytical working distance: 10 mm

Ports: 12

EDS take-off angle: 35°

Three simultaneous EDS detectors possible, two at 180°

Coplanar EDS/EBSD orthogonal to the tilt axis of the stage

Detectors

The Apreo 2 SEM detects up to four signals simultaneously

from any combination of the available detectors or detector

segments (optional):

Trinity Detection System (in-lens and in-column)

T1 segmented lower in-lens detector

T2 upper in-lens detector

T3 in-column detector (optional)

ETD—Everhart-Thornley SE detector

DBS—Retractable segmented under-the-lens BSED

(optional)

Low-vacuum SE detector (optional)

DBS-GAD—Lens-mounted gaseous analytical BSED

(optional)

STEM 3+—Retractable segmented detector

(BF, DF, HADF, HAADF) (optional)

IR-CCD

Thermo Scientific Nav-Cam

Camera (chamber-mounted)

ChemiSEM Technology (optional)

EDS detector size: 10, 30, or 60 mm²

Light element sensitivity down to beryllium

127 eV or 129 eV spectral resolution

Optional motorized slide available

Vacuum system

Complete oil-free vacuum system

1 × 240 l/s TMP

1 × PVP-scroll

2 × IGP

Chamber vacuum (high vacuum) <6.3 × 10-6 mbar

(after 12 hours pumping)

Evacuation time: ≤3.5 minute

Optional low-vacuum mode

10–500 Pa chamber pressure

Automatic Pressure Limiting Aperture (PLA) Loader

Sample holders

Standard multi-purpose holder uniquely mounts directly

onto the stage, hosts up to 18 standard stubs (ø12 mm),

three pre-tilted stubs, cross-section samples, and two pre-

tilted row-bar holders (optional) (38° and 90°). Tools are not

required to mount a sample.

Each optional row-bar accommodates 6 STEM grids

Wafer and custom holders (optional)

TypeEucentric goniometer stage,

5 axes motorized

XY110x110 mm

Repeatability <3.0 μm (@ 0° tilt)

Motorized Z65 mm

Rotationn × 360°

Tilt -15° / +90°

Max. sample heightClearance 85 mm to eucentric point

Max. sample weight 500 g in any stage position

Up to 5 kg at 0° tilt

Max. sample size122 mm diameter with full

X, Y, rotation (larger samples

possible with limited stage

travel or rotation)

System control

64-bit GUI with Windows 10, keyboard, optical mouse

24-inch LCD display, WUXGA 1920×1200

(second monitor optional)

Customizable graphical user interface,

with up to 4 simultaneously active views

FLASH automated image tuning for focus,

lens align, and stigmator

Image registration

Navigation montage

Image analysis software

Undo / Redo functionality

User guidance for basic operations / applications

Optional joystick

Optional manual user interface (knob board)

Image processor

Dwell time range from 25 ns to 25 ms/pixel

Up to 6144×4096 pixels

File type: TIFF (8-, 16-, 24-bit), JPEG or BMP

Single-frame or 4-view image display

SmartScan Mode (256-frame average or integration, line

integration and averaging, interlaced scanning)

DCFI (drift compensated frame integration) Mode

Digital image improvement and noise reduction filter

Accessories (optional)

Sample / chamber cleaning: CryoCleaner,

Warranty and Training

1 year warranty

Choice of service maintenance contracts

Choice of operation / application training contracts

Integrated Plasma Cleaner

Analysis: EDS, EBSD, WDS, CL, Raman

Thermo Scientific QuickLoader Load Lock for fast

sample transfer

Navigation: correlative navigation, Thermo Scientific Maps

Installation requirement

(Refer to preinstall guide for detailed data)

Power:

Voltage 100–240 V AC (-6%, +10%)

Frequency 50 or 60 Hz (±1%)

Consumption: <3.0 kVA for basic microscope

Earth resistance <0.1 Ω

Environment:

Temperature (20 ± 3)°C

Relative humidity below 80%

Stray AC magnetic fields <40 nT asynchronous, <100

Software tiling and stitching

Gas injection: up to 2 units (other accessories may limit

number of GIS available) for beam-induced deposition of:

Platinum

Tungsten

Carbon

Manipulators

Cryo-stage

Electrical probing / multi-probing stations

Electrostatic beam blanker

CleanConnect Sample Transfer Device

nT synchronous for line times, 20 ms (50 Hz mains) or

17 ms (60 Hz mains)

Minimum door size: 0.9 m wide × 1.9 m high

Weight: column console 980 kg

Dry nitrogen recommended for venting

Compressed air 4–6 bar, clean, dry and oil-free

System chiller

Acoustics: site survey required,

Software options

Maps Software for automatic large area acquisition using

tiling and stitching; correlative work

Thermo Scientific AutoScript

4 Software—Python-based

application programming interface

TopoMaps for image colorization, image analysis,

and 3D surface reconstruction

Advanced image analysis software

Remote control software

as acoustic spectrum relevant

Floor vibrations: site survey required,

as floor spectrum relevant

Optional active vibration isolation table

Documentation

Online user guidance

Operating instructions handbook

Online help

Prepared for RAPID (remote diagnostic support)

Free access to online resources for owners

Consumables (partial list)

Replacement Schottky electron source module

L earn more at /apreo

For research use only. Not for use in diagnostic procedures. For current certifications, visit /certifications

© 2023 Thermo Fisher Scientific Inc. All rights reserved. All trademarks are the property of Thermo Fisher Scientific

and its subsidiaries unless otherwise specified. DS0345-EN-07-2023

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