2024年5月5日发(作者：公冶子琳)
Create a Quality Connection to Your
Target System
To make sure you have the tools
for dependable state and timing
measurements, no matter what
mix of chip packages, test ports
and probes your application
requires, we’ve created the
largest line of probing solutions
in the industry.
Accurate measurements start
with reliable probing. Agilent
Technologies offers a wide variety
of probing accessories to support
your measurement needs, making
it easy to connect your Agilent
logic analyzer to your design.
Each is designed for a specific
measurement need because the
physical and electrical quality of
the connection can mean the dif-
ference between a good measure-
ment and a bad one.
NOTE: Probes are ordered separately.
Please specify probes when ordering to
ensure the correct connection between
your logic analyzer and device under test.
Probing Solutions for Logic Analyzers
Catalog
About this Document
Table of Contents
To assist you in choosing the best
Reliable Connections
Ensure Accuracy. . . . . . . . . . . . . . . . . . . . 2
state/timing probing solution for
Which Logic Analyzer?. . . . . . . . . . . . . 3
your particular target, this docu-
Quick Selection Guide. . . . . . . . . . . . . . 4
ment will consider the following:
Selecting the Optimum
Probing Strategy. . . . . . . . . . . . . . . . . . . . 5
•Chip packaging, test ports
For All Agilent Logic Analyzers with
•Special physical and electrical
40-pin Pod Connectors. . . . . . . . . . . . . . . . . 5
considerations
For All Agilent Logic Analyzers with
•Other accessories and options
90-pin Pod Connectors. . . . . . . . . . . . . . . . . 7
General-Purpose Probing. . . . . . . . . . . . 8
Other Reference Documents
QFP Package Probing. . . . . . . . . . . . . . . 9
General-Purpose Probing. . . . . . . . . . . 12
For All Agilent Logic Analyzers with
Additional information on
40-pin Pod Connectors. . . . . . . . . . . . . . . . 12
probing solutions can be found
Designing and Probing with
at /find/
Target Connections. . . . . . . . . . . . . . . . 15
logic_analyzer_probes.
Normal-Density, Medium-Performance
Applications. . . . . . . . . . . . . . . . . . . . . . . . . 15
For information on probes and
For All Agilent Logic Analyzers with
40-pin Pod Connectors. . . . . . . . . . . . . . . . 16
accessories for the other related
Probing Individual Pins of
Agilent Technologies logic
High-Density Connectors. . . . . . . . . . . . . . 34
analysis system products listed
For All Agilent Logic Analyzers with
below, please refer to “Related
40-pin Pod Connectors. . . . . . . . . . . . . . . . 36
Information” in this document:
Agilent Logic Analyzers with
90-pin Pod Connectors. . . . . . . . . . . . . . . . 41
Agilent 16760A 1.5 Gbits/Sec
•Pattern generators
Logic Analyzer Module. . . . . . . . . . . . . . . . 58
Agilent Logic Analyzers with
90-pin Pod Connectors. . . . . . . . . . . . . . . . 59
General-Purpose Probing. . . . . . . . . . . 61
Agilent Logic Analyzers with
90-pin Pod Connectors. . . . . . . . . . . . . . . . 61
Agilent 16517A/16518A
1 GHz State / 4 GHz Timing. . . . . . . . . 66
Related Information. . . . . . . . . . . . . . . . 68
Support, Services, and Assistance. . . 69
Reliable Connections Ensure Accuracy
•Impedance
High input impedance
ensures minimum intrusion on
your circuit. Although many
probes might be acceptable for
lower frequencies, capacitive
loading becomes significant
at higher frequencies. The
Agilent Technologies probing
products perform over a wide
frequency spectrum.
•Ruggedness
Probes with quality
mechanical design provide
solid electrical connections.
Intermittent open circuits
would only add one more
variable to your debugging
equation. Agilent probes
are mechanically designed
to relieve strain and ensure
rugged, reliable connection.
•Immunity to Noise
Electromagnetic noise can
corrupt data captured by
the logic analyzer. Agilent
probing solutions are
designed for a high immunity
to transient noise.
•Performance
Agilent logic analyzers have
front-end circuitry that
supports the state and
timing specifications of
the analyzer. This circuitry,
together with the Agilent
probing solutions described in
this document, will accurately
capture the target signals at
the specified clock rates.
2
Signal Frequency Content Drives Probing Solutions
Faster clock rates demand tighter timing tolerances, such as setup
and hold specifications. Systems with faster clock rates usually
have shorter rise and fall times. Signals with shorter transition
times have more high frequency content and are more susceptible
to high frequency analog problems such as cross talk, reflections,
ground bounce, noise and emissions. Susceptibility of a system to
analog problems relates to the transition times of the signals, not
the clock rate. A system with slow transition times cannot have
high clock rates. However, it is possible for a system with slower
clock rates to have signals with very fast transition times.
General-purpose probing solutions provide the analog bandwidth
required to run each logic analyzer module at its maximum clock
rate. The high input impedance of these probes, especially at high
frequencies, presents a minimal load to most systems. Systems
that are operating with little margin should be designed with
consideration for both the system components and the input
impedance of the probing solution being used during debug.
Input impedance specifications or equivalent load diagrams
can be found for each of the probing solutions described in
this document.
Other Considerations
Physical connection compatibility
between various Agilent probes
may allow you to mix and
match a variety of probes and
accessories. However, a probe
accessory designed for slower
clock speeds will not deliver
high-speed target performance
simply because it is used with a
higher speed analyzer module.
Also, the serial connection of
multiple probe leads and/or
accessories will degrade
signal integrity.
2024年5月5日发(作者：公冶子琳)
Create a Quality Connection to Your
Target System
To make sure you have the tools
for dependable state and timing
measurements, no matter what
mix of chip packages, test ports
and probes your application
requires, we’ve created the
largest line of probing solutions
in the industry.
Accurate measurements start
with reliable probing. Agilent
Technologies offers a wide variety
of probing accessories to support
your measurement needs, making
it easy to connect your Agilent
logic analyzer to your design.
Each is designed for a specific
measurement need because the
physical and electrical quality of
the connection can mean the dif-
ference between a good measure-
ment and a bad one.
NOTE: Probes are ordered separately.
Please specify probes when ordering to
ensure the correct connection between
your logic analyzer and device under test.
Probing Solutions for Logic Analyzers
Catalog
About this Document
Table of Contents
To assist you in choosing the best
Reliable Connections
Ensure Accuracy. . . . . . . . . . . . . . . . . . . . 2
state/timing probing solution for
Which Logic Analyzer?. . . . . . . . . . . . . 3
your particular target, this docu-
Quick Selection Guide. . . . . . . . . . . . . . 4
ment will consider the following:
Selecting the Optimum
Probing Strategy. . . . . . . . . . . . . . . . . . . . 5
•Chip packaging, test ports
For All Agilent Logic Analyzers with
•Special physical and electrical
40-pin Pod Connectors. . . . . . . . . . . . . . . . . 5
considerations
For All Agilent Logic Analyzers with
•Other accessories and options
90-pin Pod Connectors. . . . . . . . . . . . . . . . . 7
General-Purpose Probing. . . . . . . . . . . . 8
Other Reference Documents
QFP Package Probing. . . . . . . . . . . . . . . 9
General-Purpose Probing. . . . . . . . . . . 12
For All Agilent Logic Analyzers with
Additional information on
40-pin Pod Connectors. . . . . . . . . . . . . . . . 12
probing solutions can be found
Designing and Probing with
at /find/
Target Connections. . . . . . . . . . . . . . . . 15
logic_analyzer_probes.
Normal-Density, Medium-Performance
Applications. . . . . . . . . . . . . . . . . . . . . . . . . 15
For information on probes and
For All Agilent Logic Analyzers with
40-pin Pod Connectors. . . . . . . . . . . . . . . . 16
accessories for the other related
Probing Individual Pins of
Agilent Technologies logic
High-Density Connectors. . . . . . . . . . . . . . 34
analysis system products listed
For All Agilent Logic Analyzers with
below, please refer to “Related
40-pin Pod Connectors. . . . . . . . . . . . . . . . 36
Information” in this document:
Agilent Logic Analyzers with
90-pin Pod Connectors. . . . . . . . . . . . . . . . 41
Agilent 16760A 1.5 Gbits/Sec
•Pattern generators
Logic Analyzer Module. . . . . . . . . . . . . . . . 58
Agilent Logic Analyzers with
90-pin Pod Connectors. . . . . . . . . . . . . . . . 59
General-Purpose Probing. . . . . . . . . . . 61
Agilent Logic Analyzers with
90-pin Pod Connectors. . . . . . . . . . . . . . . . 61
Agilent 16517A/16518A
1 GHz State / 4 GHz Timing. . . . . . . . . 66
Related Information. . . . . . . . . . . . . . . . 68
Support, Services, and Assistance. . . 69
Reliable Connections Ensure Accuracy
•Impedance
High input impedance
ensures minimum intrusion on
your circuit. Although many
probes might be acceptable for
lower frequencies, capacitive
loading becomes significant
at higher frequencies. The
Agilent Technologies probing
products perform over a wide
frequency spectrum.
•Ruggedness
Probes with quality
mechanical design provide
solid electrical connections.
Intermittent open circuits
would only add one more
variable to your debugging
equation. Agilent probes
are mechanically designed
to relieve strain and ensure
rugged, reliable connection.
•Immunity to Noise
Electromagnetic noise can
corrupt data captured by
the logic analyzer. Agilent
probing solutions are
designed for a high immunity
to transient noise.
•Performance
Agilent logic analyzers have
front-end circuitry that
supports the state and
timing specifications of
the analyzer. This circuitry,
together with the Agilent
probing solutions described in
this document, will accurately
capture the target signals at
the specified clock rates.
2
Signal Frequency Content Drives Probing Solutions
Faster clock rates demand tighter timing tolerances, such as setup
and hold specifications. Systems with faster clock rates usually
have shorter rise and fall times. Signals with shorter transition
times have more high frequency content and are more susceptible
to high frequency analog problems such as cross talk, reflections,
ground bounce, noise and emissions. Susceptibility of a system to
analog problems relates to the transition times of the signals, not
the clock rate. A system with slow transition times cannot have
high clock rates. However, it is possible for a system with slower
clock rates to have signals with very fast transition times.
General-purpose probing solutions provide the analog bandwidth
required to run each logic analyzer module at its maximum clock
rate. The high input impedance of these probes, especially at high
frequencies, presents a minimal load to most systems. Systems
that are operating with little margin should be designed with
consideration for both the system components and the input
impedance of the probing solution being used during debug.
Input impedance specifications or equivalent load diagrams
can be found for each of the probing solutions described in
this document.
Other Considerations
Physical connection compatibility
between various Agilent probes
may allow you to mix and
match a variety of probes and
accessories. However, a probe
accessory designed for slower
clock speeds will not deliver
high-speed target performance
simply because it is used with a
higher speed analyzer module.
Also, the serial connection of
multiple probe leads and/or
accessories will degrade
signal integrity.