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半导体传感器ADG608BRZ中文规格书

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2024年5月8日发(作者:池青曼)

ADG604–SPECIFICATIONS

SINGLE SUPPLY

1

Parameter

ANALOG SWITCH

Analog Signal Range

On Resistance (R

ON

)

On Resistance Match Between

Channels (⌬R

ON

)

LEAKAGE CURRENTS

Source OFF Leakage I

S

(OFF)

Drain OFF Leakage I

D

(OFF)

Channel ON Leakage I

D

, I

S

(ON)

DIGITAL INPUTS

Input High Voltage, V

INH

Input Low Voltage, V

INL

Input Current

I

INL

or I

INH

C

IN

, Digital Input Capacitance

DYNAMIC CHARACTERISTICS

Transition Time

t

ON

Enable

t

OFF

Enable

Break-Before-Make Time Delay, t

BBM

Charge Injection

Off Isolation

Channel-to-Channel Crosstalk

Bandwidth –3 dB

C

S

(OFF)

C

D

(OFF)

C

D

,

C

S

(ON)

POWER REQUIREMENTS

I

DD

NOTES

1

Y Version Temperature Range: –40°C to +125°C.

Specifications subject to change without notice.

(V

DD

= 3 V ؎ 10%, V

SS

= 0 V, GND = 0 V. All specifications –40؇C to +125؇C unless otherwise noted.)

25؇C

–40؇C to

+85؇C

–40؇C to

+125؇C

0 V to V

DD

380420460

5

±0.01

±0.1

±0.01

±0.1

±0.01

±0.1

Unit

V

ΩTyp

ΩTyp

nA Typ

nA Max

nA Typ

nA Max

nA Typ

nA Max

V Min

V Max

µA Typ

µA Max

pF Typ

ns Typ

ns Max

ns Typ

ns Max

ns Typ

ns Max

ns Typ

ns Min

pC Typ

dB Typ

dB Typ

MHz Typ

pF Typ

pF Typ

pF Typ

V

IN

= V

INL

or V

INH

V

DD

= 2.7 V, V

SS

= 0 V

V

S

= 1.5 V, I

S

= –1 mA,

Test Circuit 1

V

S

= 1.5 V, I

S

= –1 mA

V

DD

= 3.3 V

V

S

= 1 V/3 V, V

D

= 3 V/1 V,

Test Circuit 2

V

S

= 1 V/3 V, V

D

= 3 V/1 V,

Test Circuit 2

V

S

= V

D

= 1 V/3 V,

Test Circuit 3

Test Conditions/Comments

±0.25

±0.5

±0.5

±4

±8

±10

2.0

0.8

0.005

2

170

320

180

250

100

160

100

0.3

–65

70

250

5

17

18

±0.1

390

265

205

450

390

225

10

V

S1

= 2 V, V

S4

= 0 V, R

L

= 300 Ω,

C

L

= 35 pF, Test Circuit 4

R

L

= 300 Ω, C

L

= 35 pF

V

S

= 2 V, Test Circuit 6

R

L

= 300 Ω, C

L

= 35 pF

V

S

= 2 V, Test Circuit 6

R

L

= 300 Ω, C

L

= 35 pF,

V

S1

= V

S2

= 2 V, Test Circuit 5

V

S

= 0 V to 3.3 V, R

S

= 0 Ω, C

L

= 1 µF,

Test Circuit 7

R

L

= 50 Ω, C

L

= 5 pF, f = 10 MHz,

Test Circuit 8

R

L

= 50 Ω, C

L

= 5 pF, f = 10 MHz,

Test Circuit 10

R

L

= 50 Ω, C

L

= 5 pF, Test Circuit 9

f = 1 MHz

f = 1 MHz

f = 1 MHz

V

DD

= 3.3 V

Digital Inputs = 0 V or 3.3 V

0.001

1.0

µA Typ

µA Max

–4–

REV. A

2024年5月8日发(作者:池青曼)

ADG604–SPECIFICATIONS

SINGLE SUPPLY

1

Parameter

ANALOG SWITCH

Analog Signal Range

On Resistance (R

ON

)

On Resistance Match Between

Channels (⌬R

ON

)

LEAKAGE CURRENTS

Source OFF Leakage I

S

(OFF)

Drain OFF Leakage I

D

(OFF)

Channel ON Leakage I

D

, I

S

(ON)

DIGITAL INPUTS

Input High Voltage, V

INH

Input Low Voltage, V

INL

Input Current

I

INL

or I

INH

C

IN

, Digital Input Capacitance

DYNAMIC CHARACTERISTICS

Transition Time

t

ON

Enable

t

OFF

Enable

Break-Before-Make Time Delay, t

BBM

Charge Injection

Off Isolation

Channel-to-Channel Crosstalk

Bandwidth –3 dB

C

S

(OFF)

C

D

(OFF)

C

D

,

C

S

(ON)

POWER REQUIREMENTS

I

DD

NOTES

1

Y Version Temperature Range: –40°C to +125°C.

Specifications subject to change without notice.

(V

DD

= 3 V ؎ 10%, V

SS

= 0 V, GND = 0 V. All specifications –40؇C to +125؇C unless otherwise noted.)

25؇C

–40؇C to

+85؇C

–40؇C to

+125؇C

0 V to V

DD

380420460

5

±0.01

±0.1

±0.01

±0.1

±0.01

±0.1

Unit

V

ΩTyp

ΩTyp

nA Typ

nA Max

nA Typ

nA Max

nA Typ

nA Max

V Min

V Max

µA Typ

µA Max

pF Typ

ns Typ

ns Max

ns Typ

ns Max

ns Typ

ns Max

ns Typ

ns Min

pC Typ

dB Typ

dB Typ

MHz Typ

pF Typ

pF Typ

pF Typ

V

IN

= V

INL

or V

INH

V

DD

= 2.7 V, V

SS

= 0 V

V

S

= 1.5 V, I

S

= –1 mA,

Test Circuit 1

V

S

= 1.5 V, I

S

= –1 mA

V

DD

= 3.3 V

V

S

= 1 V/3 V, V

D

= 3 V/1 V,

Test Circuit 2

V

S

= 1 V/3 V, V

D

= 3 V/1 V,

Test Circuit 2

V

S

= V

D

= 1 V/3 V,

Test Circuit 3

Test Conditions/Comments

±0.25

±0.5

±0.5

±4

±8

±10

2.0

0.8

0.005

2

170

320

180

250

100

160

100

0.3

–65

70

250

5

17

18

±0.1

390

265

205

450

390

225

10

V

S1

= 2 V, V

S4

= 0 V, R

L

= 300 Ω,

C

L

= 35 pF, Test Circuit 4

R

L

= 300 Ω, C

L

= 35 pF

V

S

= 2 V, Test Circuit 6

R

L

= 300 Ω, C

L

= 35 pF

V

S

= 2 V, Test Circuit 6

R

L

= 300 Ω, C

L

= 35 pF,

V

S1

= V

S2

= 2 V, Test Circuit 5

V

S

= 0 V to 3.3 V, R

S

= 0 Ω, C

L

= 1 µF,

Test Circuit 7

R

L

= 50 Ω, C

L

= 5 pF, f = 10 MHz,

Test Circuit 8

R

L

= 50 Ω, C

L

= 5 pF, f = 10 MHz,

Test Circuit 10

R

L

= 50 Ω, C

L

= 5 pF, Test Circuit 9

f = 1 MHz

f = 1 MHz

f = 1 MHz

V

DD

= 3.3 V

Digital Inputs = 0 V or 3.3 V

0.001

1.0

µA Typ

µA Max

–4–

REV. A

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